摘要
本文介绍了对MCS-51系列单片机进行测试所采用的理论和算法。我们对单片机的测试分为两个阶段。第一阶段称为初测阶段,采用从大开始法。在这一阶段测试出故障的芯片就被淘汰了,不再进行严格的测试。第二阶段称为详测阶段,这一阶段采用结构与功能兼测法,试图把故障定位到寄存器一级。这一阶段,首先按单片机的总体结构框图进行模块划分,再根据系统图理论,对每一模块建立其故障模型,结合从小开始法和最小指令覆盖法给出测试算法。
This paper describes the theory and algorithms with which we test the MCS-51 series single-chip micro- computer.
Our approach providied for testing the MCS-51 series single-chip microcomputer can be divided into two phases. In the initial test phase, use start large method. The faulty chip being tested by this phase will be got rid of, and no more strict tests needed. The second phase ia called detailed test phase. In this phase, Using both structure and functional test method, we try to locate the faults on register-level. First, we partition the chip into some small functional blocks using the global structure-block diagram of single-chip microcomputers, then we use system-graph, theory to make the fault model for each block, combining start-small method and minimal number instruction covered method to give testing algorithms.
出处
《计算机应用与软件》
CSCD
1994年第4期56-64,F003,共10页
Computer Applications and Software
关键词
微处理机
功能
测试
故障
Single-chip microcomputer, test generation, fault diagnosis, computer aided test, functional test, microprocessor test.
