摘要
为有效划分低可测性模拟电路中的模糊组和正则模糊组,提出一种新的确定线性组合矩阵最简形式的方法。通过一个benchmark电路验证该方法仅需对被测电路的可测性矩阵进行一次QR分解和较少次数的矩阵运算;避免了组合搜索算法的搜索时间与被测元件参数的数目成几何级数增长,减小了计算处理的复杂度。
A new method for determination of a minimum form of the linear combination matrix is presented to partition efficiently the ambiguity group and canonical ambiguity group in low testability analog circuits. The experiment on one benchmark circuit demonstrates that the method has features as follows: it only needs a single QR factorization applied to the testability matrix of the circuit under test and a few matrix computations. It also avoids the exponential dependence of the search time of the combinational search algorithm on the number of tested components' parameters, thus reducing its computational complexity.
出处
《系统工程与电子技术》
EI
CSCD
北大核心
2005年第5期761-763,共3页
Systems Engineering and Electronics
基金
国家自然科学基金(60372001)
四川省青年科技基金(04ZQ026 031)资助课题
关键词
可测性矩阵
线性组合矩阵
模糊组
QR分解
testability matrix
linear combination matrix
ambiguity group
QR factorization
