摘要
介绍了常用的先进分析方法—扫描电子显微镜(SEM)和X-射线电子能谱(XPS),同时结合实验对其运用进行了详细的介绍和分析。结果表明:SEM和XPS相结合应用于涂层分析,可以很好地获得涂层形貌和结构的信息。
The common analytical methods such as scanning electronic microscopy(SEM) and x-ray photoemission spectroscopy (XPS) were introduced. The applications of them in the analysis of the coating of coated paper were discussed according to experiments. The results showed the combination of SEM and XPS was a very good approach for studying the appearance and structure of the coating.
出处
《造纸科学与技术》
2005年第2期9-12,共4页
Paper Science & Technology
