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SolGel法制备PI/SiO_2纳米复合薄膜及结构与性能 被引量:8

Preparation of PI/SiO_2 nanocomposite films by Sol Gel process and its structure and properties
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摘要 采用溶胶 凝胶法 (Sol Gel)制备了二氧化硅不同质量分数的聚酰亚胺 /二氧化硅 (PI/SiO2 )纳米复合薄膜。并用TEM、力学性能、吸水性能及介电性能测试等方法研究了薄膜的结构与性能。结果表明 ,SiO2 微粒均匀分散在PI基体中 ,粒径随着SiO2 含量的增加而增大 ;当SiO2 质量分数在 2 0 %以内时对PI基体有增强作用 ,且在 1 0 %左右拉伸强度达到最大 ,而吸水率逐渐减小 。 A series of polyimide/silica(PI/SiO_ 2) nanocomposite films with different silica contents were successfully prepared by Sol Gel reaction. TEM,mechanical analysis,water absorption and dielectrics property analysis were employed to characterize the structure and properties of PI/SiO_2 films. The results indicate that the SiO_2 particles homogeneously disperse in the PI matrix and the size of particles increase with the increase in the contents of SiO_2. If the content of SiO_2 is no more than 20% in the matrix of PI, the tensile strength of the film can be improved and reaches a maximum at 10%, the water absorption reduces and the dielectric constants changes a little with the increase in the contents of SiO_2.
出处 《北京化工大学学报(自然科学版)》 CAS CSCD 北大核心 2005年第1期59-61,共3页 Journal of Beijing University of Chemical Technology(Natural Science Edition)
关键词 溶胶-凝胶法 聚酰亚胺 二氧化硅 纳米复合薄膜 Sol Gel process polyimide silica nanocomposite films
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