摘要
在论述连续X射线的线性吸收系数的测量对透视成像系统和透射式的工业在线检测系统中的作用的基础上,阐述了对连续X射线的线性吸收系数的测量原理,并在测量原理的基础上对连续X射线的线性吸收系数的测量的误差的产生因素进行了分析,以利于从测量方法上加以校正,并对高压交联电缆中的外半导体屏蔽层、内半导体屏蔽层、绝缘层的线性吸收系数进行了详细的测量。
The principle of measurement of the continuous X-ray linear absorption coefficient is explained in this paper on the basis of the function of prospective image system and the prospective on line industry detection system ;the factors of the causes for the measurement error of the continuous X-ray linear absorption coefficient are analyzed,so as to correct the measure method.The linear absorption coefficient of the outer semiconductive shield layer?inner semiconductive shield layer and insulator layer of HV XLPE power cables is measured in detail.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2005年第2期124-126,149,共4页
Nuclear Electronics & Detection Technology
基金
核工业科学基金(97E008001)
湖南省科技厅重点资助项目(99SSY2001)
