摘要
本文引入了一个概率空间来描述集成电路合格率优化问题，并将合格率表示为可行域的概率测度。所提出的变权重ＭｏｎｔｅＣａｒｌｏ法适合于合格率不太高的场合，而改进后的ＳＡ算法则适合于合格率比较高的场合。这些方法已应用于ＹＯＳＩＣ系统中，并取得了满意的效果。
In this paper,a probability space is introduced to describe IC yield optimization problem,and the probability measure of the feasible region is employed to indicate the yield The weighted Monte Carlo method is snitable in the early optimizzation stage,while the improved SA algorithm is more efficient in the final stage.Using these methods,the yield optimization system for integrated circuits (YOSIC)works very well.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1994年第11期106-109,共4页
Acta Electronica Sinica
基金
863高技术项目
