摘要
介绍新研制的“YY-Ⅰ型亚微压入仪”的结构,原理及应用。该仪器在计算机控制下可完成材料表面微米或亚微米级涂层、镀层,离子注入层等的硬度、硬度分布曲线、弹性模量及复合材料中纤维基体界面剪切力的测定等。
A new Submicron Intentation Tester manufacture by the author and its application were described. The tester controlled by computer can be used to determine the elastic modulus and hardness of thin film , coating and ion-implanted layer, and also used to measure debording force of the fiber/matrix interface in composites.
出处
《表面技术》
EI
CAS
CSCD
1994年第5期224-228,共5页
Surface Technology
关键词
亚微压入仪
涂层
材料
表面处理
submicron intentation tester, coating, hardness, elastic modulus
