摘要
随着科学技术的迅速发展,电磁环境日益复杂,雷电、静电和各种电子对抗装备及电磁脉冲武器等电磁脉冲源产生的电磁辐射场,不仅可对电路和仪器造成干扰或损伤,而且对微电子系统和国防设施亦构成了一定的威胁.国内外研究动态和电磁脉冲参数、作用机理以及实验研究表明:电磁脉冲,特别是快上升沿的脉冲电磁场,对单片机、GPS系统和含有微电子器件及电爆装置的机电系统,都会造成干扰或损伤.其作用机理可概括为"绝热效应"、"电磁辐射场作用"、"静电场作用"和电流产生的磁场效应.
With the rapid development of science and technology, the electromagnetic environment is becoming complex. Electromagnetic field generated by EMP sources (such as thunder, static and (electromagnetic) countermeasure equipments and EMP weapons) can not only interfere or damage circuits and equipments, but also be hazardous to micro-electric systems and national defense establishments. Both domestic and foreign research trends, EMP parameters, effect mechanism and experiments show that EMP, especially EMP with fast rising edge, can interfere or damage single chip microprocessors, GPS system and electromechanical which contains micro-electric and electro-explosive devices. The effect mechanism can be summarized as thermal insulation effects, electromagnetic field effects, electrostatic effects and magnetic effects generated by current.
出处
《装备指挥技术学院学报》
2005年第1期1-6,共6页
Journal of the Academy of Equipment Command & Technology
基金
国家自然科学基金资助重点项目(50237040)
中国工程院2004咨询课题项目(2003/R)
关键词
电磁脉冲
电磁环境效应
作用机理
发展趋势
EMP
electromagnetic environment effects
effect mechanism
trend of development
