摘要
铁电薄膜是一类重要的功能材料,铁电畴是其物理基础。综述了铁电薄膜中电畴的表征方法(高分辨透射电镜、扫描力显微镜、X射线衍射、拉曼光谱等)、类型(c畴和a畴、180°畴和90°畴等)、临界尺寸(单畴临界尺寸和铁电临界尺寸)等方面的研究进展,提出了研究中需要解决的一些问题。
Ferroelectric thin film based on ferroelectric domains is one of the most important functional materials. The progress on characterization(including HRTEM, SFM, XRD and Raman spectra), critical sizes(including the single-domain critical size and the ferroelectric critical size)and the species of domain(including c domains, a domains, 180° domains and 90° domains)in ferroelectric thin films are reviewed. Merits and demerits of various methods are compared, and some problems on ferroelectric domains are outlined.
出处
《材料导报》
EI
CAS
CSCD
2004年第10期68-72,共5页
Materials Reports
基金
国家973项目资助
