摘要
作为 X 射线相衬成像的方法之一,衍射增强成像方法由于能获得较高的信噪比及分辨率而引起了人们的研究兴趣。北京同步辐射装置(BSRF)形貌学实验站也开展了该方法的探索研究。此前的衍射增强成像方法中,当白光 X 射线光束横截面尺寸为 20 mm×10 mm 时,经过双晶单色器后最大只能获得横截面尺寸为20 mm×4 mm 的均匀单色 X 射线,从而造成成像区域减小。在对通常衍射增强成像光路排列分析的基础上,提出了一种新的光学排列几何并进行了衍射增强实验。应用新光学排列几何首次获得了与入射白光 X 射线尺寸相当的、大的成像光斑均匀区域,因而新光学排列几何更适合于大尺寸样品的研究工作。同时,该光学排列几何成像分辨率可以达到微米量级并且更方便于实验操作。
As a technique for X-ray phase contrast imaging, diffraction-enhanced imaging (DEI) attracts much interest for its high resolution and good image quality. Some research work has also been carried out at Beijing Synchrotron Radiation Facility (BSRF) during the past few years. In general DEI set-up, the obtainable image area is less than 20 mm×4 mm when cross section of the incident “white” X-ray beam is 20 mm×10 mm, which means general DEI set-up is deficient for large samples. Based on the analysis of general DEI set-up, a new set-up has been designed and applied in DEI experiments. In new DEI set-up, obtainable image area is for the first time as large as incident “white” X-ray beam. Resolution of image obtained using new DEI set-up is around the order of micrometer.
出处
《核技术》
CAS
CSCD
北大核心
2004年第10期725-728,共4页
Nuclear Techniques
基金
国家自然科学基金重大子项目(10390014)
中国科学院高能物理所科技创新经费资助课题
关键词
同步辐射X射线
衍射增强成像
成像尺寸
X射线相衬成像
Synchrotron radiation X-ray, Diffraction-enhanced imaging, Image size, X-ray phase contrast imaging
