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双极型IC核辐射下的瞬时损坏

Transient Damages of Bipolar Integrated Circuit Under Nuclear Radiation
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摘要 本文从连续性方程和粒子通量方程出发,导出了矩形y辐射脉冲作用下双极器件中光电流的数学模型;论述了扩散电阻的光电流效应和电导调制效应,以及扩散电阻随γ剂量率变化的模型。最后给出了集成稳压电源的模拟数值与现场辐射结果的比较,并据此提出了双极型IC抗γ辐射的加固建议。 Based on the continuity equation and the particle flux equation, this paper deriveds the methematical model of photocurrent in bipolar devioes under square-pulsed γ radiation. In addition, this paper describes the photocurrent effect and the conductivity modulation effect on diffused resistors as well as the model in which the diffused resistor varies with γ radiation rate. Finally, a comparison is given which shows good agreement between the simulation of integrated voltage regulator and the practical radiation experiments, and suggestions for bipolar IC's γ radiation-hardening are presented.
作者 夏培邦
机构地区 机电部第
出处 《电子学报》 EI CAS CSCD 北大核心 1993年第2期97-100,共4页 Acta Electronica Sinica
关键词 核辐射 光电流效应 双极集成电路 Computer simulation, Nuclear radiation, Conductivity modulation effect, Photocurret effect
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