摘要
介绍了两种基于压缩二分决策图(BDD:Binary Dccision Diagram)并由压缩的BDD来进行测试生成的启发性方法,即临界二分树(CBT:Critical Binary Tree)和节点分决函数(ndf:node psrtition function)方法,它们虽然并不一定是最小化BDD,但它们减小了BDD,从而在专家系统环境下得以对大型数字系统进行测试。
This paper discusses the heuristics bassed on the reduced BDD (Binary Decision Diagram) in an environment of expert systems and two methods which arc CBT (Critical Binary Tree) heuristic and npf (node partition function) heuristic are introduced. They attempt to reduce BDD so that generate test generations depend on the reduced BDD for the large size digital system.
出处
《电子科技大学学报》
EI
CAS
CSCD
北大核心
1993年第4期375-382,共8页
Journal of University of Electronic Science and Technology of China
基金
国家八五科技攻关基金
关键词
决策图
数字电路
测试
专家系统
graph
binary decision diagram
test generation
digital circuit
test
expert systems
