摘要
为建立一套快速、准确的测量系统以适用于半导体激光器中、大规模生产的测试要求 ,利用有限元差分数值模拟方法对半导体激光器光束的近、远场分布 ,发散角等作理论模拟 ,利用测量系统对其光束的近远场分布、发散角等进行测量。最后提出相应方案处理测量结果以减小误差。与一般测量光束参数的系统相比 ,该测量系统具有兼顾简单快速与准确的优点。
The goal of this article is to present a measuring system which is fast and simple to be applied for the middle or large scale production of semiconductor lasers.The simulation is performed to the near field pattern,far field pattern and divergence angle etc.of the semiconductor laser with the finite difference analysis.A measuring system is built to measure the characteristics.Finally,the experimental system error is analyzed,and an approach to cut down the error is presented.Compared with other methods,this measuring system is simple,fast and precise.
出处
《激光技术》
CAS
CSCD
北大核心
2004年第3期298-302,共5页
Laser Technology
基金
国家八六三计划资助项目 (2 0 0 2AA3130 6 0 )
关键词
半导体激光器
光束质量
远场分布
发散角
semiconductor laser
optical beam quality
far field pattern
divergence angle
