摘要
文章研究了近紫外辐照试验前后OSR二次表面镜的电学性能变化规律,利用扫描电子显微镜(SEM)和X射线光电子能谱仪(XPS)对近紫外辐照后的涂层表面形貌和成分进行了分析,进而探讨了近紫外辐照对OSR二次表面镜导电性能变化机理。研究发现,OSR二次表面镜的表面电阻率随着紫外辐照度的增加而指数减小,氧空位吸附氧的解析、In-O键的断裂和氧空位的增加是近紫外辐照OSR二次表面镜表面电阻率降低、导电性能增强的主要原因。
The influence of near ultraviolet radiation on the electrical property of OSR second surface mirror was studied experimentally and SEM and XPS were used to analyze the surface topography and its composition. The degradation mechanism of OSR electrical property was analyzed. From test and analysis, it is found that the surface resistivity of OSR decreases with near UV irradiance exponentially, and the resolution of adsorption oxygen in oxygen vacancy, rupture of In-O bond and increase of oxygen vacancy are t...
出处
《航天器环境工程》
2008年第5期438-440,398,共4页
Spacecraft Environment Engineering
关键词
近紫外辐照
OSR
表面电阻率
导电性能
near ultraviolet irradiation
OSR
surface resistivity
electrical property
