摘要
An X-ray diffractometer that equipped with a two-dimensional detector is used for developing the technique of grainsize measurement for strong textured and coarse-grained Si steel sheet. The method is based on the concept thatthe position of diffraction spots depends on the orientation of individual grains. The two-dimensional detector hasthe ability to collect abundant diffraction information in seconds, thus it can be determined rapidly and accuratelywhether a series of diffraction spots come from the same grain. The experimental results show that this method canbe used for measuring grain size and its distribution in strong textured and coarse-grained metal sheets.
基金
This work was supported by the High-Tech Research and Development (863) Programme of China under grant No. 2001AA339030and the National Natural Science Foundation of China under grant No. 50171014.
