摘要
通过压电陶瓷微位移机构移动CCD的位置来获得所需要的互有微位移的序列低分辨率图,提出了用反演解析法对低分辨率图进行重构并得到高分辨率图的方法。通过比较重构后的图像和原图像的分辨率,验证了系统的可行性和反演解析法的正确性。
Low resolution images, which have micro displacements each other, were captured by moving the CCD array using PZT equipment. Inverse analysis algorithm was proposed to reconstruct high resolution images using the above images. Comparative result of the original and reconstructed images shows the feasibility of the PZT equipment and the correctness of the inverse analysis algorithm.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
2006年第z3期2217-2218,共2页
Chinese Journal of Scientific Instrument
