Under the trend of high integration and multi-band compatibility in consumer electronics,RF over air testing during the introduction stage of new products faces problems such as large space occupation,poor consistency...Under the trend of high integration and multi-band compatibility in consumer electronics,RF over air testing during the introduction stage of new products faces problems such as large space occupation,poor consistency,and environmental interference.The traditional broadband antenna coupling scheme is difficult to meet the accuracy and efficiency requirements of the production line due to volume redundancy,manual alignment errors,and shielding box attenuation effects.This article proposes an automated OTA testing optimization scheme based on miniaturized dual-frequency monopole antennas,which systematically solves testing pain points through compact MDMA antenna design,six-axis precision control model,and statistical process control verification method.The experiment shows that this scheme reduces the standard deviation of path loss by 40%,reduces the false alarm rate of RF desensitization from 12%to 2.5%,shortens the testing time of a single device to 8 seconds in practical applications,and increases the production yield by 9%,providing an efficient solution for high integration RF testing.展开更多
文摘Under the trend of high integration and multi-band compatibility in consumer electronics,RF over air testing during the introduction stage of new products faces problems such as large space occupation,poor consistency,and environmental interference.The traditional broadband antenna coupling scheme is difficult to meet the accuracy and efficiency requirements of the production line due to volume redundancy,manual alignment errors,and shielding box attenuation effects.This article proposes an automated OTA testing optimization scheme based on miniaturized dual-frequency monopole antennas,which systematically solves testing pain points through compact MDMA antenna design,six-axis precision control model,and statistical process control verification method.The experiment shows that this scheme reduces the standard deviation of path loss by 40%,reduces the false alarm rate of RF desensitization from 12%to 2.5%,shortens the testing time of a single device to 8 seconds in practical applications,and increases the production yield by 9%,providing an efficient solution for high integration RF testing.
