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PSP Based DCG-FGT Transistor Model Including Characterization Procedure on Dummy Cell
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作者 Abderrezak Marzaki Virginie Bidal +3 位作者 Romain Laffont Wencelas Rahajandraibe Jean-Michel Portal Rachid Bouchakour 《Journal of Energy and Power Engineering》 2012年第11期1878-1883,共6页
A new DCG-FGT (dual-control-gate floating-gate transistor) transistor model for static and transient simulations is presented. The PSP MOS (metal-oxide-semiconductor) description is used as a basis for the formula... A new DCG-FGT (dual-control-gate floating-gate transistor) transistor model for static and transient simulations is presented. The PSP MOS (metal-oxide-semiconductor) description is used as a basis for the formulation of the conduction channel behavior. The floating gate potential is implicitly computed with an added charge neutrality relation that ensures a good convergence. The model is running under electrical simulator (ELDO) and is characterized thanks to ICCAP (integrated circuit characterization and analysis program) software. It has been validated on an advanced STMicroelectronics technology. The final objective of this work is to provide an accurate and scalable model available in design framework. This device which is derived from a flash memory cell offers many possibilities for circuit design. 展开更多
关键词 晶体管模型 虚拟单元 PSP 程序 表征 FGT 意法半导体 闪速存储器
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