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Strain effect on graphene nanoribbon carrier statistic in the presence of non-parabolic band structure
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作者 N A Izuani Che Rosid M T Ahmadi Razali Ismail 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第9期480-483,共4页
The effect of tensile uniaxial strain on the non-parabolic electronic band structure of armchair graphene nanoribbon(AGNR) is investigated.In addition,the density of states and the carrier statistic based on the tig... The effect of tensile uniaxial strain on the non-parabolic electronic band structure of armchair graphene nanoribbon(AGNR) is investigated.In addition,the density of states and the carrier statistic based on the tight-binding Hamiltonian are modeled analytically.It is found that the property of AGNR in the non-parabolic band region is varied by the strain.The tunable energy band gap in AGNR upon strain at the minimum energy is described for each of n-AGNR families in the non-parabolic approximation.The behavior of AGNR in the presence of strain is attributed to the breakable AGNR electronic band structure,which varies the physical properties from its normality.The linear relation between the energy gap and the electrical properties is featured to further explain the characteristic of the deformed AGNR upon strain. 展开更多
关键词 strain graphene nanoribbon uniaxial strain current–voltage characteristic
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Open-Gate Undoped-AIGaN-GaN HEMT Structure for pH Sensing Application
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作者 Sharifabad Maneea Eizadi Zainal Abidin Mastura Shafinaz +5 位作者 Mustafa Farahiyah Hashim Abdul Manaf Abd Rahman Shaharin Fadzli Abdul Rahman Abdul Rahim Qindeel Rabia Omar Nurul Afzan 《材料科学与工程(中英文版)》 2010年第7期1-6,共6页
关键词 HEMT器件 GaN pH值 掺杂 遥感应用 结构 AN型 高电子迁移率晶体管
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Power Conversion Efficiency of Schottky Diode Fabricated on AIGaAs/GaAs Heterostructure
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作者 Parimon Norfarariyanti Mustafa Farahiyah +5 位作者 Hashim Abdui Manaf Abd Rahman Shaharin Fadzli Abdul Rahman Abdul Rahim Osman Mohd Nizam Abd Aziz Azlan Hashim Md. Roslan 《材料科学与工程(中英文版)》 2010年第6期60-65,共6页
关键词 肖特基二极管 转换效率 异质结构 微波功率 砷化镓 高电子迁移率晶体管 制备 HEMT器件
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Reliability of High Speed Ultra Low Voltage Differential CMOS Logic
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作者 Omid Mirmotahari Yngvar Berg 《Circuits and Systems》 2015年第5期121-135,共15页
In this paper, we present a solution to the ultra low voltage inverter by adding a keeper transistor in order to make the semi-floating-gate more stable and to reduce the current dissipation. Moreover, we also present... In this paper, we present a solution to the ultra low voltage inverter by adding a keeper transistor in order to make the semi-floating-gate more stable and to reduce the current dissipation. Moreover, we also present a differential ULV inverter and elaborate on the reliability and fault tolerance of the gate. The differential ULV gate compared to both a former ULV gate and standard CMOS are given. The results are obtained through Monte-Carlo simulations. 展开更多
关键词 CMOS DIFFERENTIAL FLOATING-GATE Semi-Floating-Gate KEEPER RECHARGE ULTRA Low Voltage High Speed Monte-Carlo CADENCE STM 90 nm
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NP-Domino, Ultra-Low-Voltage, High-Speed, Dual-Rail, CMOS NOR Gates
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作者 Ali Dadashi Omid Mirmotahari Yngvar Berg 《Circuits and Systems》 2016年第8期1916-1926,共11页
In this paper, novel ultra low voltage (ULV) dual-rail NOR gates are presented which use the semi-floating-gate (SFG) structure to speed up the logic circuit. Higher speed in the lower supply voltages and robustness a... In this paper, novel ultra low voltage (ULV) dual-rail NOR gates are presented which use the semi-floating-gate (SFG) structure to speed up the logic circuit. Higher speed in the lower supply voltages and robustness against the input signal delay variations are the main advantages of the proposed gates in comparison to the previously reported domino dual-rail NOR gates. The simulation results in a typical TSMC 90 nm CMOS technology show that the proposed NOR gate is more than 20 times faster than conventional dual-rail NOR gate. 展开更多
关键词 Ultra Low Voltage (ULV) Semi-Floating-Gate (SFG) Speed NOR Gate Monte Carlo TSMC 90 nm CMOS
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转移过程对CVD生长的石墨烯质量的影响
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作者 梁学磊 李伟 +5 位作者 CHENG GuangJun CALIZO Irene HACKER Christina A HIGHT WALKER Angela R RICHTER Curt A 彭练矛 《科学通报》 EI CAS CSCD 北大核心 2014年第33期3322-3328,共7页
利用化学气象沉淀法(CVD)在金属衬底上生长的石墨烯制备电子器件需要先把石墨烯转移到绝缘基底上,转移过程对器件制备的成功率和性能的均匀性有重要影响.转移过程中导致的石墨烯破损和金属生长基底残余颗粒污染受到普遍重视,然而由金属... 利用化学气象沉淀法(CVD)在金属衬底上生长的石墨烯制备电子器件需要先把石墨烯转移到绝缘基底上,转移过程对器件制备的成功率和性能的均匀性有重要影响.转移过程中导致的石墨烯破损和金属生长基底残余颗粒污染受到普遍重视,然而由金属基底腐蚀液导致的石墨烯表面污染还没有引起足够的重视.本文利用拉曼光谱和X射线光电子能谱(XPS)证明了转移过程中金属基底腐蚀液会在石墨烯表面引入污染,利用我们发展的"改良的RCA(radio corporation of America)清洗(modified RCA clean)"转移工艺能够有效地去除这种污染.这对提高后续制备的电子器件的性能有重要意义. 展开更多
关键词 石墨烯 转移 污染 拉曼光谱 XPS
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Heterodyne Standing-Wave Interferometer with Improved Phase Stability 被引量:1
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作者 Ingo Ortlepp Jens-Peter Zollner +1 位作者 Ivo W.Rangelow Eberhard Manske 《Nanomanufacturing and Metrology》 2021年第3期190-199,共10页
This paper describes a standing-wave interferometer with two laser sources of different wavelengths,diametrically opposed and emitting towards each other.The resulting standing wave has an intensity profile which is m... This paper describes a standing-wave interferometer with two laser sources of different wavelengths,diametrically opposed and emitting towards each other.The resulting standing wave has an intensity profile which is moving with a constant velocity,and is directly detected inside the laser beam by two thin and transparent photo sensors.The first sensor is at a fixed position,serving as a phase reference for the second one which is moved along the optical axis,resulting in a frequency shift,proportional to the velocity.The phase difference between both sensors is evaluated for the purpose of interferometric length measurements. 展开更多
关键词 Standing wave INTERFEROMETER HETERODYNE Ultrathin photo diode
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Tip-and Laser-based 3D Nanofabrication in Extended Macroscopic Working Areas
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作者 Ingo Ortlepp Thomas Frohlich +26 位作者 Roland FuBl Johann Reger Christoph Schaffel Stefan Sinzinger Steffen Strehle ReneTheska Lena Zentner Jens-Peter Zollner Ivo WRangelow Carsten Reinhardt Tino Hausotte Xinrui Cao Oliver Dannberg Florian Fern David Fischer Stephan Gorges Martin Hofmann Johannes Kirchner Andreas Meister Taras Sasiuk Ralf Schienbein Shraddha Supreeti Laura Mohr-Weidenfeller Christoph Weise Christoph Reuter Jaqueline Stauffenberg Eberhard Manske 《Nanomanufacturing and Metrology》 2021年第3期132-148,共17页
The field of optical lithography is subject to intense research and has gained enormous improvement.However,the effort necessary for creating structures at the size of 20 nm and below is considerable using conventiona... The field of optical lithography is subject to intense research and has gained enormous improvement.However,the effort necessary for creating structures at the size of 20 nm and below is considerable using conventional technologies.This effort and the resulting financial requirements can only be tackled by few global companies and thus a paradigm change for the semiconductor industry is conceivable:custom design and solutions for specific applications will dominate future development(Fritze in:Panning EM,Liddle JA(eds)Novel patterning technologies.International society for optics and photonics.SPIE,Bellingham,2021.https://doi.org/10.1117/12.2593229).For this reason,new aspects arise for future lithography,which is why enormous effort has been directed to the development of alternative fabrication technologies.Yet,the technologies emerging from this process,which are promising for coping with the current resolution and accuracy challenges,are only demonstrated as a proof-of-concept on a lab scale of several square micrometers.Such scale is not adequate for the requirements of modern lithography;therefore,there is the need for new and alternative cross-scale solutions to further advance the possibilities of unconventional nanotechnologies.Similar challenges arise because of the technical progress in various other fields,realizing new and unique functionalities based on nanoscale effects,e.g.,in nanophotonics,quantum computing,energy harvesting,and life sciences.Experimental platforms for basic research in the field of scale-spanning nanomeasuring and nanofabrication are necessary for these tasks,which are available at the Technische Universitiit Ilmenau in the form of nanopositioning and nanomeasuring(NPM)machines.With this equipment,the limits of technical structurability are explored for high-performance tip-based and laser-based processes for enabling real 3D nanofabrication with the highest precision in an adequate working range of several thousand cubic millimeters. 展开更多
关键词 Nanomeasuring NANOPOSITIONING NANOMANUFACTURING Scale-spanning Tip-based Laser-based Nanofabrication
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