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Theoretical Analysis and Simulation of BJFET Obstructive Characteristics 被引量:1
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作者 ZENGYun YANMin YANYong-hong FANWei 《Semiconductor Photonics and Technology》 CAS 2005年第1期52-55,共4页
A new bipolar junction field-effect transistor (BJFET) was described. The theoretical analysis and computer simulation of BJFET obstructive characteristic are achieved. The gate bias voltage affects the BJFET obstruct... A new bipolar junction field-effect transistor (BJFET) was described. The theoretical analysis and computer simulation of BJFET obstructive characteristic are achieved. The gate bias voltage affects the BJFET obstructive voltage greatly. The BJFET obstructive characteristic is relevant to structure parameters of channel width W and channel length L. The decrease-bias-voltage operation can weaken the device obstructive characteristic. The forward turn in device forward obstructive region can also affect the BJFET obstructive characteristic. BJFET has a good high temperature obstructive characteristic and can be applying to high temperature status as high voltage switch devices. 展开更多
关键词 bipolar junction FET obstructive characteristic computer simulation
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