The micro-mechanism of the silicon-based waveguide surface smoothing is investigated systematically to explore the effects of silicon-hydrogen bonds on high-temperature hydrogen annealing waveguides. The effect of sil...The micro-mechanism of the silicon-based waveguide surface smoothing is investigated systematically to explore the effects of silicon-hydrogen bonds on high-temperature hydrogen annealing waveguides. The effect of silicon- hydrogen bonds on the surface migration movement of silicon atoms and the waveguide surface topography are revealed. The micro-migration from an upper state to a lower state of silicon atoms is driven by silicon- hydrogen bonding, which is the key to ameliorate the rough surface morphology of the silicon-based waveguide. The process of hydrogen annealing is experimentally validated based on the simulated parameters. The surface roughness declines from 1.523nm to 0.461 nm.展开更多
为深入了解界面润湿性对流固摩擦能量输出的影响机制,该文利用石墨烯薄膜制作不同界面接触角的俘能结构并进行实验测试。此外,基于分子动力学理论建立Couette模型并进行仿真验证。研究发现,俘能结构输出的电压随着接触角的增大而增加,...为深入了解界面润湿性对流固摩擦能量输出的影响机制,该文利用石墨烯薄膜制作不同界面接触角的俘能结构并进行实验测试。此外,基于分子动力学理论建立Couette模型并进行仿真验证。研究发现,俘能结构输出的电压随着接触角的增大而增加,接触角为69.5°的俘能结构对应输出的电压是0.95 m V,相比接触角为45°时输出的0.57 m V增长67%;输出的电压极性与溶液流动的方向有关;而且电压幅值与溶液流动速度及浓度有关,与流动速度成非线性关系。结合模拟结果提出一种界面润湿性对流固摩擦能量输出效率的影响机制,结果表明:宏观接触角是表征界面对水分子的束缚力的参数,也是影响溶液在界面附近滑移速度的关键因素,溶液离子拖动电子移动速度受滑移速度影响,并将最终决定输出电压大小。展开更多
基金Supported by the National Natural Science Foundation of China under Grant Nos 51505324,91123036,61471255 and 61474079the Specialized Research Fund for the Doctoral Program of Higher Education under Grant No 20131402110013the Foundation for Young Scholars of Shanxi Province under Grant No 2014021023-3
文摘The micro-mechanism of the silicon-based waveguide surface smoothing is investigated systematically to explore the effects of silicon-hydrogen bonds on high-temperature hydrogen annealing waveguides. The effect of silicon- hydrogen bonds on the surface migration movement of silicon atoms and the waveguide surface topography are revealed. The micro-migration from an upper state to a lower state of silicon atoms is driven by silicon- hydrogen bonding, which is the key to ameliorate the rough surface morphology of the silicon-based waveguide. The process of hydrogen annealing is experimentally validated based on the simulated parameters. The surface roughness declines from 1.523nm to 0.461 nm.
文摘为深入了解界面润湿性对流固摩擦能量输出的影响机制,该文利用石墨烯薄膜制作不同界面接触角的俘能结构并进行实验测试。此外,基于分子动力学理论建立Couette模型并进行仿真验证。研究发现,俘能结构输出的电压随着接触角的增大而增加,接触角为69.5°的俘能结构对应输出的电压是0.95 m V,相比接触角为45°时输出的0.57 m V增长67%;输出的电压极性与溶液流动的方向有关;而且电压幅值与溶液流动速度及浓度有关,与流动速度成非线性关系。结合模拟结果提出一种界面润湿性对流固摩擦能量输出效率的影响机制,结果表明:宏观接触角是表征界面对水分子的束缚力的参数,也是影响溶液在界面附近滑移速度的关键因素,溶液离子拖动电子移动速度受滑移速度影响,并将最终决定输出电压大小。
