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Modeling and resolution analysis of microcylinder-assisted microscopy in reflection and transmission modes
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作者 Felix Rosenthal Tobias Pahl +4 位作者 Lucie Hüser Michael Diehl Tim Eckhardt Sebastian Hagemeier Peter Lehmann 《Advanced Photonics Nexus》 2025年第4期22-33,共12页
Microsphere and microcylinder-assisted microscopy(MAM)has grown steadily over the last decade and is still an intensively studied optical far-field imaging technique that promises to overcome the fundamental lateral r... Microsphere and microcylinder-assisted microscopy(MAM)has grown steadily over the last decade and is still an intensively studied optical far-field imaging technique that promises to overcome the fundamental lateral resolution limit of microscopy.However,the physical effects leading to resolution enhancement are still frequently debated.In addition,various configurations of MAM operating in transmission mode as well as reflection mode are examined,and the results are sometimes generalized.We present a rigorous simulation model of MAM and introduce a way to quantify the resolution enhancement.The lateral resolution is compared for microscope arrangements in reflection and transmission modes.Furthermore,we discuss different physical effects with respect to their contribution to resolution enhancement.The results indicate that the effects impacting the resolution in MAM strongly depend on the arrangement of the microscope and the measurement object.As a highlight,we outline that evanescent waves in combination with whispering gallery modes also improve the imaging capabilities,enabling super-resolution under certain circumstances.This result is contrary to the conclusions drawn from previous studies,where phase objects have been analyzed,and thus further emphasizes the complexity of the physical mechanisms underlying MAM. 展开更多
关键词 microsphere-assisted microscopy resolution enhancement resolution limit electromagnetic modeling SUPER-RESOLUTION whispering gallery mode
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Electromagnetic modeling of interference,confocal,and focus variation microscopy 被引量:1
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作者 Tobias Pahl Felix Rosenthal +5 位作者 Johannes Breidenbach Corvin Danzglock Sebastian Hagemeier Xin Xu Marco Künne Peter Lehmann 《Advanced Photonics Nexus》 2024年第1期104-116,共13页
We present a unified electromagnetic modeling of coherence scanning interferometry,confocal microscopy,and focus variation microscopy as the most common techniques for surface topography inspection with micro-and nano... We present a unified electromagnetic modeling of coherence scanning interferometry,confocal microscopy,and focus variation microscopy as the most common techniques for surface topography inspection with micro-and nanometer resolution.The model aims at analyzing the instrument response and predicting systematic deviations.Since the main focus lies on the modeling of the microscopes,the light–surface interaction is considered,based on the Kirchhoff approximation extended to vectorial imaging theory.However,it can be replaced by rigorous methods without changing the microscope model.We demonstrate that all of the measuring instruments mentioned above can be modeled using the same theory with some adaption to the respective instrument.For validation,simulated results are confirmed by comparison with measurement results. 展开更多
关键词 interference microscopy coherence scanning interferometry confocal microscopy focus variation microscopy electromagnetic modeling surface topography measurement
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Microsphere-assisted quantitative phase microscopy:a review 被引量:1
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作者 Vahid Abbasian Tobias Pahl +4 位作者 Lucie Hüser Sylvain Lecler Paul Montgomery Peter Lehmann Arash Darafsheh 《Light(Advanced Manufacturing)》 2024年第1期131-150,共20页
Light microscopes are the most widely used devices in life and material sciences that allow the study of the interaction of light with matter at a resolution better than that of the naked eye.Conventional microscopes ... Light microscopes are the most widely used devices in life and material sciences that allow the study of the interaction of light with matter at a resolution better than that of the naked eye.Conventional microscopes translate the spatial differences in the intensity of the reflected or transmitted light from an object to pixel brightness differences in the digital image.However,a phase microscope converts the spatial differences in the phase of the light from or through an object to differences in pixel brightness.Interference microscopy,a phase-based approach,has found application in various disciplines.While interferometry has brought nanometric axial resolution,the lateral resolution in quantitative phase microscopy(QPM)has still remained limited by diffraction,similar to other traditional microscopy systems.Enhancing the resolution has been the subject of intense investigation since the invention of the microscope in the 17th century.During the past decade,microsphere-assisted microscopy(MAM)has emerged as a simple and effective approach to enhance the resolution in light microscopy.MAM can be integrated with QPM for 3D label-free imaging with enhanced resolution.Here,we review the integration of microspheres with coherence scanning interference and digital holographic microscopies,discussing the associated open questions,challenges,and opportunities. 展开更多
关键词 Phase microscopy Digital holographic microscopy MICROSPHERE RESOLUTION
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FEM-based modeling of microsphereenhanced interferometry 被引量:4
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作者 Tobias Pahl Lucie Hüser +1 位作者 Sebastian Hagemeier Peter Lehmann 《Light(Advanced Manufacturing)》 2022年第4期73-85,共13页
To improve the lateral resolution in microscopic imaging,microspheres are placed close to the object’s surface in order to support the imaging process by optical near-field information.Although microsphere-assisted m... To improve the lateral resolution in microscopic imaging,microspheres are placed close to the object’s surface in order to support the imaging process by optical near-field information.Although microsphere-assisted measurements are part of various recent studies,no generally accepted explanation for the effect of microspheres exists.Photonic nanojets,enhancement of the numerical aperture,whispering-gallery modes and evanescent waves are usually named reasons in context with microspheres,though none of these effects is proven to be decisive for the resolution enhancement.We present a simulation model of the complete microscopic imaging process of microsphere-enhanced interference microscopy including a rigorous treatment of the light scattering process at the surface of the specimen.The model consideres objective lenses of high numerical aperture providing 3D conical illumination and imaging.The enhanced resolution and magnification by the microsphere is analyzed with respect to the numerical aperture of the objective lenses.Further,we give a criterion for the achievable resolution and demonstrate that a local enhancement of the numerical aperture is the most likely reason for the resolution enhancement. 展开更多
关键词 Electromagnetic modeling Microsphere-assisted microscopy Interference microscopy Coherence scanning interferometry Simulation Finite element method
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