Some electrical parameters of the SIS-type hysteretic underdamped Josephson junction(JJ)can be measured by its current-voltage characteristics(IVCs).Currents and voltages at JJ are commensurate with the intrinsic nois...Some electrical parameters of the SIS-type hysteretic underdamped Josephson junction(JJ)can be measured by its current-voltage characteristics(IVCs).Currents and voltages at JJ are commensurate with the intrinsic noise level of measuring instruments.This leads to the need for multiple measurements with subsequent statistical processing.In this paper,the digital algorithms are proposed for the automatic measurement of the JJ parameters by IVC.These algorithms make it possible to implement multiple measurements and check these JJ parameters in an automatic mode with the required accuracy.The complete sufficient statistics are used to minimize the root-mean-square error of parameter measurement.A sequence of current pulses with slow rising and falling edges is used to drive JJ,and synchronous current and voltage readings at JJ are used to realize measurement algorithms.The algorithm performance is estimated through computer simulations.The significant advantage of the proposed algorithms is the independence from current source noise and intrinsic noise of current and voltage meters,as well as the simple implementation in automatic digital measuring systems.The proposed algorithms can be used to control JJ parameters during mass production of superconducting integrated circuits,which will improve the production efficiency and product quality.展开更多
The diffraction of a dielectric microline pair is optimized by numerical simulations to generate an efficient focusing pattern with a micron-scale footprint. Microlines separated by 1.12 μm are fabricated by two-phot...The diffraction of a dielectric microline pair is optimized by numerical simulations to generate an efficient focusing pattern with a micron-scale footprint. Microlines separated by 1.12 μm are fabricated by two-photon polymerization on a glass substrate, and their diffraction pattern is characterized by three-dimensional wide-field transmission microscopy. A line pair, having a width W=0.40 μm and a height H=0.80 μm, leads to diffraction-limited focusing in the visible spectrum. Depending on wavelength, its focal length, lateral resolution,and depth of focus are in the ranges of 0.8–1.3 μm, 0.22–0.44 μm, and 1.7–2.13μm, respectively. Such a microlens based on the diffraction of only two subwavelength scatterers could be used for the design of miniature optical sensors with micron and sub-micron pixels.展开更多
基金the Ministry of Science and Higher Education of the Russian Federation under Grant No.FSUN-2023-0007.
文摘Some electrical parameters of the SIS-type hysteretic underdamped Josephson junction(JJ)can be measured by its current-voltage characteristics(IVCs).Currents and voltages at JJ are commensurate with the intrinsic noise level of measuring instruments.This leads to the need for multiple measurements with subsequent statistical processing.In this paper,the digital algorithms are proposed for the automatic measurement of the JJ parameters by IVC.These algorithms make it possible to implement multiple measurements and check these JJ parameters in an automatic mode with the required accuracy.The complete sufficient statistics are used to minimize the root-mean-square error of parameter measurement.A sequence of current pulses with slow rising and falling edges is used to drive JJ,and synchronous current and voltage readings at JJ are used to realize measurement algorithms.The algorithm performance is estimated through computer simulations.The significant advantage of the proposed algorithms is the independence from current source noise and intrinsic noise of current and voltage meters,as well as the simple implementation in automatic digital measuring systems.The proposed algorithms can be used to control JJ parameters during mass production of superconducting integrated circuits,which will improve the production efficiency and product quality.
文摘The diffraction of a dielectric microline pair is optimized by numerical simulations to generate an efficient focusing pattern with a micron-scale footprint. Microlines separated by 1.12 μm are fabricated by two-photon polymerization on a glass substrate, and their diffraction pattern is characterized by three-dimensional wide-field transmission microscopy. A line pair, having a width W=0.40 μm and a height H=0.80 μm, leads to diffraction-limited focusing in the visible spectrum. Depending on wavelength, its focal length, lateral resolution,and depth of focus are in the ranges of 0.8–1.3 μm, 0.22–0.44 μm, and 1.7–2.13μm, respectively. Such a microlens based on the diffraction of only two subwavelength scatterers could be used for the design of miniature optical sensors with micron and sub-micron pixels.
