In 1986, Binnig et al. developed the first atomic force microscope (AFM). The AFM, unlike the scanning tunnelling microscope (STM), has no demands for electrical conductivity, so it has been used in science and techno...In 1986, Binnig et al. developed the first atomic force microscope (AFM). The AFM, unlike the scanning tunnelling microscope (STM), has no demands for electrical conductivity, so it has been used in science and technology more widely. In 1988, the AFM was improved, and the AFM employing laser beam deflection for force detection (laser-AFM) was developed. In 1990, laser-AFM got the atomic-resolution. Up till now, the AFM has developed into a very important technique for studying the surface.展开更多
The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which...The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which Binnig and Rohrer received the 1986 Nobel Prize in Physics. Shortly after that, in 1986 Binnig together with Quate and Gerber introduced the first atomic force microscope (AFM). Unlike the STM, the AFM展开更多
文摘In 1986, Binnig et al. developed the first atomic force microscope (AFM). The AFM, unlike the scanning tunnelling microscope (STM), has no demands for electrical conductivity, so it has been used in science and technology more widely. In 1988, the AFM was improved, and the AFM employing laser beam deflection for force detection (laser-AFM) was developed. In 1990, laser-AFM got the atomic-resolution. Up till now, the AFM has developed into a very important technique for studying the surface.
文摘The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which Binnig and Rohrer received the 1986 Nobel Prize in Physics. Shortly after that, in 1986 Binnig together with Quate and Gerber introduced the first atomic force microscope (AFM). Unlike the STM, the AFM
