We present a new approach based on the multi-trench technique to improve the electrical performances, which are the fill factor and the electrical efficiency. The key idea behind this approach is to introduce a new mu...We present a new approach based on the multi-trench technique to improve the electrical performances, which are the fill factor and the electrical efficiency. The key idea behind this approach is to introduce a new multi-trench region in the intrinsic layer, in order to modulate the total resistance of the solar cell. Based on 2- D numerical investigation and optimization of amorphous SiGe double-junction （a-Si：H/a-SiGe：H） thin film solar cells, in the present paper numerical models of electrical and optical parameters are developed to explain the impact of the multi-trench technique on the improvement of the double-junction solar cell electrical behavior for high performance photovoltaic applications. In this context, electrical characteristics of the proposed design are analyzed and compared with conventional amorphous silicon double-junction thin-film solar cells.展开更多
The double gate （DG） silicon MOSFET with an extremely short-channel length has the appropriate fea- tures to constitute the devices for nanoscale circuit design. To develop a physical model for extremely scaled DG M...The double gate （DG） silicon MOSFET with an extremely short-channel length has the appropriate fea- tures to constitute the devices for nanoscale circuit design. To develop a physical model for extremely scaled DG MOSFETs, the drain current in the channel must be accurately determined under the application of drain and gate voltages. However, modeling the transport mechanism for the nanoscale structures requires the use of overkill meth- ods and models in terms of their complexity and computation time （self-consistent, quantum computations ）. Therefore, new methods and techniques are required to overcome these constraints. In this paper, a new approach based on the fuzzy logic computation is proposed to investigate nanoscale DG MOSFETs. The proposed approach has been implemented in a device simulator to show the impact of the proposed approach on the nanoelectronic cir- cuit design. The approach is general and thus is suitable for any type ofnanoscale structure investigation problems in the nanotechnology industry.展开更多
A fuzzy framework based on an adaptive network fuzzy inference system（ANFIS） is proposed to evaluate the relative degradation of the basic subthreshold parameters due to hot-carrier effects for nanoscale thin-film d...A fuzzy framework based on an adaptive network fuzzy inference system（ANFIS） is proposed to evaluate the relative degradation of the basic subthreshold parameters due to hot-carrier effects for nanoscale thin-film double-gate（DG） MOSFETs.The effect of the channel length and thickness on the resulting degradation is addressed, and 2-D numerical simulations are used for the elaboration of the training database.Several membership function shapes are developed,and the best one in terms of accuracy is selected.The predicted results agree well with the 2-D numerical simulations and can be efficiently used to investigate the impact of the interface fixed charges and quantum confinement on nanoscale DG MOSFET subthreshold behavior.Therefore,the proposed ANFIS-based approach offers a simple and accurate technique to study nanoscale devices,including the hot-carrier and quantum effects.展开更多
基金supported by the Agence Thématique de Recherche en Sciences et Technologie(ATRST),Government of Algeria,under Grant Pro Thème/87/2015
文摘We present a new approach based on the multi-trench technique to improve the electrical performances, which are the fill factor and the electrical efficiency. The key idea behind this approach is to introduce a new multi-trench region in the intrinsic layer, in order to modulate the total resistance of the solar cell. Based on 2- D numerical investigation and optimization of amorphous SiGe double-junction （a-Si：H/a-SiGe：H） thin film solar cells, in the present paper numerical models of electrical and optical parameters are developed to explain the impact of the multi-trench technique on the improvement of the double-junction solar cell electrical behavior for high performance photovoltaic applications. In this context, electrical characteristics of the proposed design are analyzed and compared with conventional amorphous silicon double-junction thin-film solar cells.
文摘The double gate （DG） silicon MOSFET with an extremely short-channel length has the appropriate fea- tures to constitute the devices for nanoscale circuit design. To develop a physical model for extremely scaled DG MOSFETs, the drain current in the channel must be accurately determined under the application of drain and gate voltages. However, modeling the transport mechanism for the nanoscale structures requires the use of overkill meth- ods and models in terms of their complexity and computation time （self-consistent, quantum computations ）. Therefore, new methods and techniques are required to overcome these constraints. In this paper, a new approach based on the fuzzy logic computation is proposed to investigate nanoscale DG MOSFETs. The proposed approach has been implemented in a device simulator to show the impact of the proposed approach on the nanoelectronic cir- cuit design. The approach is general and thus is suitable for any type ofnanoscale structure investigation problems in the nanotechnology industry.
文摘A fuzzy framework based on an adaptive network fuzzy inference system（ANFIS） is proposed to evaluate the relative degradation of the basic subthreshold parameters due to hot-carrier effects for nanoscale thin-film double-gate（DG） MOSFETs.The effect of the channel length and thickness on the resulting degradation is addressed, and 2-D numerical simulations are used for the elaboration of the training database.Several membership function shapes are developed,and the best one in terms of accuracy is selected.The predicted results agree well with the 2-D numerical simulations and can be efficiently used to investigate the impact of the interface fixed charges and quantum confinement on nanoscale DG MOSFET subthreshold behavior.Therefore,the proposed ANFIS-based approach offers a simple and accurate technique to study nanoscale devices,including the hot-carrier and quantum effects.
