The real time and in situ investigation of the crystallization process and structure transitions of asymmetric crystalline-crystalline diblock copolymers from the melt was performed with synchrotron simultaneous SAXS/...The real time and in situ investigation of the crystallization process and structure transitions of asymmetric crystalline-crystalline diblock copolymers from the melt was performed with synchrotron simultaneous SAXS/WAXS. The asymmetric poly（ethylene oxide）-b-poly（ε-caprolactone） diblock copolymers were chosen for the present study. It was shown that the short blocks crystallized later than the long blocks and final lamellar structure was formed in all of the asymmetric diblock copolymers. The final lamellar structure was confirmed by AFM observation. The SAXS data were analyzed with different methods for the early stage of the crystallization. The Guinier plots indicated that there were no isolated domains formed before the formation of lamellae in the asymmetric diblock copolymers during the crystallization process. Debye- Bueche plots implied the formation of correlated domains during crystallization.展开更多
The structural behavior of binary Cu50Zr50 and ternary Cu50Zr45Ti5 bulk metallic glasses (BMGs) under applied stress was investigated by means of in-situ high energy X-ray synchrotron diffraction. The components of th...The structural behavior of binary Cu50Zr50 and ternary Cu50Zr45Ti5 bulk metallic glasses (BMGs) under applied stress was investigated by means of in-situ high energy X-ray synchrotron diffraction. The components of the strain tensors were determined from the shifts of the maxima of the atomic pair correlation functions (PDF) in real space. The anisotropic atomic reorientation in the first-nearest-neighbor shell versus stress suggests structural rearrangements in short-range order. Within the plastic deformation range the overall strain of the metallic glass is equal to the yield strain. After unloading,the atomic structure returns to the stress-free state,and the short-range order is identical to that of the undeformed state. Plastic deformation,however,leads to localized shear bands whose contribution to the volume averaged diffraction pattern is too weak to be detected. A concordant region evidenced by the anisotropic component is activated to counterbalance the stress change due to the atomic bond reorientation in the first-nearest-neighbor shell. The size of the concordant region is an important factor dominating the yield strength and the plastic strain ability of the BMGs.展开更多
The atomic and electronic structure of graphene synthesized on commercially available cubic-SiC（001）/Si（001） wafers have been studied by low energy electron microscopy （LEEM）, scanning tunneling microscopy （STM...The atomic and electronic structure of graphene synthesized on commercially available cubic-SiC（001）/Si（001） wafers have been studied by low energy electron microscopy （LEEM）, scanning tunneling microscopy （STM）, low energy electron diffraction （LEED）, and angle resolved photoelectron spectroscopy （ARPES）. LEEM and STM data prove the wafer-scale continuity and uniform thickness of the graphene overlayer on SIC（001）. LEEM, STM and ARPES studies reveal that the graphene overlayer on SIC（001） consists of only a few monolayers with physical properties of quasi-freestanding graphene. Atomically resolved STM and micro-LEED data show that the top graphene layer consists of nanometer-sized domains with four different lattice orientations connected through the 〈110〉-directed boundaries. ARPES studies reveal the typical electron spectrum of graphene with the Dirac points close to the Fermi level. Thus, the use of technologically relevant SiC（001）/Si（001） wafers for graphene fabrication repre-sents a realistic way of bridging the gap between the outstanding properties of graphene and their applications.展开更多
基金supported by the National Natural Science Foundation of China (Nos. 20974077, 51173130)Synchrotron experiments at Beam line A2 were supported by HASYLAB project (I-20110306, II20090111)
文摘The real time and in situ investigation of the crystallization process and structure transitions of asymmetric crystalline-crystalline diblock copolymers from the melt was performed with synchrotron simultaneous SAXS/WAXS. The asymmetric poly（ethylene oxide）-b-poly（ε-caprolactone） diblock copolymers were chosen for the present study. It was shown that the short blocks crystallized later than the long blocks and final lamellar structure was formed in all of the asymmetric diblock copolymers. The final lamellar structure was confirmed by AFM observation. The SAXS data were analyzed with different methods for the early stage of the crystallization. The Guinier plots indicated that there were no isolated domains formed before the formation of lamellae in the asymmetric diblock copolymers during the crystallization process. Debye- Bueche plots implied the formation of correlated domains during crystallization.
基金the Alexander von Humboldt Foundation for financial supportsupported by the National Natural Science Foundation of China (50731008)
文摘The structural behavior of binary Cu50Zr50 and ternary Cu50Zr45Ti5 bulk metallic glasses (BMGs) under applied stress was investigated by means of in-situ high energy X-ray synchrotron diffraction. The components of the strain tensors were determined from the shifts of the maxima of the atomic pair correlation functions (PDF) in real space. The anisotropic atomic reorientation in the first-nearest-neighbor shell versus stress suggests structural rearrangements in short-range order. Within the plastic deformation range the overall strain of the metallic glass is equal to the yield strain. After unloading,the atomic structure returns to the stress-free state,and the short-range order is identical to that of the undeformed state. Plastic deformation,however,leads to localized shear bands whose contribution to the volume averaged diffraction pattern is too weak to be detected. A concordant region evidenced by the anisotropic component is activated to counterbalance the stress change due to the atomic bond reorientation in the first-nearest-neighbor shell. The size of the concordant region is an important factor dominating the yield strength and the plastic strain ability of the BMGs.
文摘The atomic and electronic structure of graphene synthesized on commercially available cubic-SiC（001）/Si（001） wafers have been studied by low energy electron microscopy （LEEM）, scanning tunneling microscopy （STM）, low energy electron diffraction （LEED）, and angle resolved photoelectron spectroscopy （ARPES）. LEEM and STM data prove the wafer-scale continuity and uniform thickness of the graphene overlayer on SIC（001）. LEEM, STM and ARPES studies reveal that the graphene overlayer on SIC（001） consists of only a few monolayers with physical properties of quasi-freestanding graphene. Atomically resolved STM and micro-LEED data show that the top graphene layer consists of nanometer-sized domains with four different lattice orientations connected through the 〈110〉-directed boundaries. ARPES studies reveal the typical electron spectrum of graphene with the Dirac points close to the Fermi level. Thus, the use of technologically relevant SiC（001）/Si（001） wafers for graphene fabrication repre-sents a realistic way of bridging the gap between the outstanding properties of graphene and their applications.
