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MAPPING THE DAMAGED ZONE AROUND THE CRACK TIP IN HIGH DENSITY POLYETHYLENE WITH SYNCHROTRON MICROFOCUS SMALL ANGLE X-RAY SCATTERING TECHNIQUE 被引量:3
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作者 Hans-Friedrich Enderle Dieter Lilge +3 位作者 Stephan V.Roth Rainer Gehrke Jens Rieger 门永锋 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2010年第2期165-170,共6页
The structural changes around a crack tip in a high density polyethylene were investigated by means of scanning synchrotron microfocus small-angle X-ray scattering technique. The scattering data confirm the process of... The structural changes around a crack tip in a high density polyethylene were investigated by means of scanning synchrotron microfocus small-angle X-ray scattering technique. The scattering data confirm the process of craze structure development near a crack tip based on the evolution of voids. In addition, it was found that the main stress in the plastic zone near a crack tip exhibited a gradient distribution with respect to its strength and direction. The whole damaged area showed a strain distribution indicating a flow behavior toward the crack tip. 展开更多
关键词 High density polyethylene Microfocus SAXS Crack tip Voids.
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