A new active digital pixel circuit for CMOS image sensor is designed consisting of four components: a photo-transducer, a preamplifier, a sample & hold (S & H) circuit and an A/D converter with an inverter. It...A new active digital pixel circuit for CMOS image sensor is designed consisting of four components: a photo-transducer, a preamplifier, a sample & hold (S & H) circuit and an A/D converter with an inverter. It is optimized by simulation and adjustment based on 2 μm standard CMOS process. Each circuit of the components is designed with specific parameters. The simulation results of the whole pixel circuits show that the circuit has such advantages as low distortion, low power consumption, and improvement of the output performances by using an inverter.展开更多
A new fault model, called the X-fault model, is proposed for fault diagnosisof physical defects with unknown behaviors by using X symbols. An efficient X-fault simulationmethod and an efficient X-fault diagnostic reas...A new fault model, called the X-fault model, is proposed for fault diagnosisof physical defects with unknown behaviors by using X symbols. An efficient X-fault simulationmethod and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based onthe X-fault model can improve the accuracy of failure analysis for a wide range of physical defectsin complex and deep submicron integrated circuits.展开更多
文摘A new active digital pixel circuit for CMOS image sensor is designed consisting of four components: a photo-transducer, a preamplifier, a sample & hold (S & H) circuit and an A/D converter with an inverter. It is optimized by simulation and adjustment based on 2 μm standard CMOS process. Each circuit of the components is designed with specific parameters. The simulation results of the whole pixel circuits show that the circuit has such advantages as low distortion, low power consumption, and improvement of the output performances by using an inverter.
文摘A new fault model, called the X-fault model, is proposed for fault diagnosisof physical defects with unknown behaviors by using X symbols. An efficient X-fault simulationmethod and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based onthe X-fault model can improve the accuracy of failure analysis for a wide range of physical defectsin complex and deep submicron integrated circuits.
