Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce t...Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce tests for the Multiple-Condition Criterion(M-CC) and the Modified Condition/Decision Criterion(MC/DC), and describes the design of the C program Coverage Measurement Tool (CCMT), which can record dynamic behaviors of C programs and quantify test coverage.展开更多
The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a few parameters, every combination of valid values of arbitrary n(n >_2) parameters be covere...The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a few parameters, every combination of valid values of arbitrary n(n >_2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained.展开更多
文摘Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce tests for the Multiple-Condition Criterion(M-CC) and the Modified Condition/Decision Criterion(MC/DC), and describes the design of the C program Coverage Measurement Tool (CCMT), which can record dynamic behaviors of C programs and quantify test coverage.
文摘The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a few parameters, every combination of valid values of arbitrary n(n >_2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained.
