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Cross-Polarized GPR Imaging of Fracture Flow Channeling 被引量:3
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作者 Georgios P.Tsoflias Christopher Perll +1 位作者 Matthew Baker Matthew W.Becker 《Journal of Earth Science》 SCIE CAS CSCD 2015年第6期776-784,共9页
Ground penetrating radar(GPR) can be used to image fractures and monitor fluid flow in the subsurface. Conventional GPR imaging uses single-polarization, co-polarized acquisition. We examine the use of cross-polariz... Ground penetrating radar(GPR) can be used to image fractures and monitor fluid flow in the subsurface. Conventional GPR imaging uses single-polarization, co-polarized acquisition. We examine the use of cross-polarized GPR signals for imaging flow channeling in a discrete horizontal fracture. Numerical modeling(FDTD) demonstrates that when the fracture channel is oriented at an oblique angle to the survey line, depolarization of the GPR signal results in scattered energy along the cross-polarized components. When the channel is oriented parallel or orthogonal to the survey line, all scattered energy is captured by the co-polarized components and no signal is present in the cross-polarized orientation. Multipolarization, time-lapse 3D GPR field data were acquired at the Altona Flat Rock test site in New York State. The GPR surveys were conducted during background fresh fracture water conditions and during a natural gradient saline tracer test which was used to highlight flow channels along a sub-horizontal fracture. Amplitude analysis of the cross-polarized data reveals flow channeling that is in agreement with the co-polarized GPR images and with independent hydraulic tests. This investigation demonstrates that cross-polarized components of GPR signals can be used to enhance imaging of flow channels in fractured media. 展开更多
关键词 GPR single-polarization cross-polarized data rapid flow saline tracer fractured rock.
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Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases 被引量:4
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作者 Steve J. Chipera David L. Bish 《Advances in Materials Physics and Chemistry》 2013年第1期47-53,共7页
Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction pattern is the s... Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction pattern is the sum of the individual phases that compose the sample. By adding an internal standard (usually corundum) to both the observed patterns and to those for individual pure phases (standards), all patterns can all be normalized to an equivalent intensity based on the internal standard intensity. Using least-squares refinement, the individual phase proportions are varied until an optimal match is reached. As the fitting of full patterns uses the entire pattern, including background, disordered and amorphous phases are explicitly considered as individual phases, with their individual intensity profiles or “amorphous humps” included in the refinement. The method can be applied not only to samples that contain well-ordered materials, but it is particularly well suited for samples containing amorphous and/or disordered materials. In cases with extremely disordered materials where no crystal structure is available for Rietveld refinement or there is no unique intensity area that can be measured for a traditional RIR analysis, full-pattern fitting may be the best or only way to readily obtain quantitative results. This approach is also applicable in cases where there are several coexisting highly disordered phases. As all phases are considered as discrete individual components, abundances are not constrained to sum to 100%. 展开更多
关键词 Full-Pattern QUANTITATIVE X-Ray DIFFRACTION XRD
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