期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
P-type AlAs/[GaAs/AlAs] Semiconductor/Superlattice DBR Grown by MBE
1
作者 YANChang-ling ZHONGJing-chang 《Semiconductor Photonics and Technology》 CAS 2001年第1期8-12,41,共6页
A p-type AlAs(70.2 nm)/16.5 period [GaAs(3 nm)/AlAs(0.7 nm)] semiconductor/superlatice distributed Bragg reflector (DBR) has been grown on n +-GaAs(100) substrate by V80H molecular beam epitaxy system. Experimental re... A p-type AlAs(70.2 nm)/16.5 period [GaAs(3 nm)/AlAs(0.7 nm)] semiconductor/superlatice distributed Bragg reflector (DBR) has been grown on n +-GaAs(100) substrate by V80H molecular beam epitaxy system. Experimental reflection spectrum shows that its central wavelength is 820 nm, with the peak reflectivity for 10-pair DBR of as high as 96 %, and the reflection bandwidth of as wide as 90 nm. We formed a 20×20 μm 2 square mesa to measure the series resistance using wet chemical etching. From the measurement result, the series resistance of about 50 Ω is obtained at a moderate doping (3×10 18 cm -3 ). Finally, the dependence of the resistance of the DBR on the temperature is analyzed. From the experimental result, it is found that the mechanism of the low series resistance of this kind of DBR may increase the tunneling current in the semiconductor/superlattice mirror structure, which will result in a decrease in series resistance. 展开更多
关键词 Distributed Bragg reflector SUPERLATTICE Reflection spectrum Series resistance Molecular beam epitaxy
在线阅读 下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部