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Comprehensive study of crystalline AlN/sapphire templates after high-temperature annealing with various sputtering conditions 被引量:1
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作者 Wen Gu Zhibin Liu +7 位作者 Yanan Guo Xiaodong Wang Xiaolong Jia Xingfang Liu Yiping Zeng Junxi Wang Jinmin Li Jianchang Yan 《Journal of Semiconductors》 EI CAS CSCD 2020年第12期94-100,共7页
High-quality AlN/sapphire templates were fabricated by the combination of sputtering and high-temperature(HT)annealing.The influence of sputtering parameters including nitrogen flux,radio frequency power,and substrate... High-quality AlN/sapphire templates were fabricated by the combination of sputtering and high-temperature(HT)annealing.The influence of sputtering parameters including nitrogen flux,radio frequency power,and substrate temperature on the crystalline quality and surface morphology of annealed AlN films were investigated.With lower substrate temperature,lower power,and lower N2 flux,the full width at half maximum of the X-ray rocking curve for AlN(0002)and(102)were improved to 97.2 and 259.2 arcsec after high-temperature annealing.This happens because the increased vacancy concentration of sputtered AlN films can facilitate the annihilation of dislocations by increasing the recovery rate during HT annealing.Step and step-bunching morphologies were clearly observed with optimized sputtering conditions. 展开更多
关键词 SPUTTER ANNEALING ALN dislocation density
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