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Imaging atomic-scale chemistry from fused multi-modal electron microscopy 被引量:1
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作者 Jonathan Schwartz Zichao Wendy Di +9 位作者 Yi Jiang Alyssa J.Fielitz Don-Hyung Ha Sanjaya D.Perera Ismail El Baggari Richard D.Robinson Jeffrey A.Fessler Colin Ophus Steve Rozeveld Robert Hovden 《npj Computational Materials》 SCIE EI CSCD 2022年第1期164-171,共8页
Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions.Here,fused multi-modal electron microscopy offers high signal-to-noi... Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions.Here,fused multi-modal electron microscopy offers high signal-to-noise ratio(SNR)recovery of material chemistry at nano-and atomic-resolution by coupling correlated information encoded within both elastic scattering(high-angle annular dark-field(HAADF))and inelastic spectroscopic signals(electron energy loss(EELS)or energy-dispersive x-ray(EDX)).By linking these simultaneously acquired signals,or modalities,the chemical distribution within nanomaterials can be imaged at significantly lower doses with existing detector hardware.In many cases,the dose requirements can be reduced by over one order of magnitude.This high SNR recovery of chemistry is tested against simulated and experimental atomic resolution data of heterogeneous nanomaterials. 展开更多
关键词 MATERIALS CHEMISTRY FUSED
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