The reliability analysis of vertically integrated protection devices is crucial for designing International Electrotechnical Commission(IEC)61850-based substations.This paper presents the hardware architecture of a fo...The reliability analysis of vertically integrated protection devices is crucial for designing International Electrotechnical Commission(IEC)61850-based substations.This paper presents the hardware architecture of a four-inone vertically integrated device and the information transmission path of each function based on the functional information transmission chain of protection devices,measurement and control devices,merging units,and intelligent terminals.Additionally,a reliability analysis model of the protection device and its protection system is constructed using the fault tree analysis method while considering the characteristics of each module of the vertically integrated device.The stability probability of the protection system in each state is analyzed by combining the state-transfer equations of line and busbar protection with a Markov chain.Finally,the failure rate and availability of the protection device and its protection system are calculated under different ambient temperatures using a 110 kV intelligent substation as an example.The sensitivity of each device module is analyzed.展开更多
Instead of the conventional design with five contacts in the sensor active area, innovative vertical Hall devices （VHDs） with four contacts and six contacts are asymmetrical in structural design but symmetrical in t...Instead of the conventional design with five contacts in the sensor active area, innovative vertical Hall devices （VHDs） with four contacts and six contacts are asymmetrical in structural design but symmetrical in the current flow that can be well fit for the spinning current technique for offset elimination. In this article, a conformal mapping calculation method is used to predict the performance of asymmetrical VHD embedded in a deep n-well with four contacts. Furthermore, to make the calculation more accurate, the junction field effect is also involved into the conformal mapping method. The error between calculated and simulated results is less than 5% for the currentrelated sensitivity, and approximately 13% for the voltage-related sensitivity. This proves that such calculations can be used to predict the optimal structure of the vertical Hall-devices.展开更多
基金supported by the 2020 Infrastructure Engineering Technology Innovation Projectthe“Intelligent Substation”Supporting Technology Research Project(031200WS22200001)。
文摘The reliability analysis of vertically integrated protection devices is crucial for designing International Electrotechnical Commission(IEC)61850-based substations.This paper presents the hardware architecture of a four-inone vertically integrated device and the information transmission path of each function based on the functional information transmission chain of protection devices,measurement and control devices,merging units,and intelligent terminals.Additionally,a reliability analysis model of the protection device and its protection system is constructed using the fault tree analysis method while considering the characteristics of each module of the vertically integrated device.The stability probability of the protection system in each state is analyzed by combining the state-transfer equations of line and busbar protection with a Markov chain.Finally,the failure rate and availability of the protection device and its protection system are calculated under different ambient temperatures using a 110 kV intelligent substation as an example.The sensitivity of each device module is analyzed.
基金supported by the Natural Science Foundation of Jiangsu Province,China(Nos.BK20131379,BK20141431)the Graduate Research and Innovation Projects of Jiangsu Province(No.SJLX_0373)
文摘Instead of the conventional design with five contacts in the sensor active area, innovative vertical Hall devices （VHDs） with four contacts and six contacts are asymmetrical in structural design but symmetrical in the current flow that can be well fit for the spinning current technique for offset elimination. In this article, a conformal mapping calculation method is used to predict the performance of asymmetrical VHD embedded in a deep n-well with four contacts. Furthermore, to make the calculation more accurate, the junction field effect is also involved into the conformal mapping method. The error between calculated and simulated results is less than 5% for the currentrelated sensitivity, and approximately 13% for the voltage-related sensitivity. This proves that such calculations can be used to predict the optimal structure of the vertical Hall-devices.
