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Enabling high performance n-type metal oxide semiconductors at low temperatures for thin film transistors
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作者 Nidhi Tiwari Amoolya Nirmal +2 位作者 Mohit Rameshchandra Kulkarni Rohit Abraham John Nripan Mathews 《Inorganic Chemistry Frontiers》 2020年第9期1822-1844,共23页
Amorphous oxide semiconductors have drawn considerable attention as a replacement for ubiquitous silicon based technologies.By virtue of their flexible substrate compatibility and transparency,amorphous metal oxide se... Amorphous oxide semiconductors have drawn considerable attention as a replacement for ubiquitous silicon based technologies.By virtue of their flexible substrate compatibility and transparency,amorphous metal oxide semiconductor(AOS)thin film transistors(TFTs)are being explored in emerging flexible/transparent technologies.However,rapid advances in such technologies require the development of high-performance thin film transistors,which can be fabricated at low processing temperatures.In this review paper,we discuss the recent progress made in n-type semiconductor TFTs activated at low temperatures both on rigid and flexible substrates with a focus on the replacement of conventional high temperature annealing.Several low temperature processing approaches that have been reported in both vacuum deposited and solution processed n-type metal oxide semiconductor based thin film transistors are evaluated,with an emphasis on some novel techniques which can effectively modulate the electronic properties of the n-type metal oxide semiconductor systems at low temperatures.The final part of this review draws conclusions and discusses the outlook for future research efforts in achieving low temperature activated high performance n-type TFTs. 展开更多
关键词 n type metal oxide semiconductors thin film transistors amorphous oxide semiconductors low temperatures flexible substrates thin film transistorswhich metal oxide semiconductor aos thin high performance
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