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Relationship between the parent charge transfer gap and maximum transition temperature in cuprates 被引量:3
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作者 Wei Ruan Cheng Hu +10 位作者 Jianfa Zhao Peng Cai Yingying Peng Cun Ye Runze Yu Xintong Li Zhenqi Hao Changqing Jin Xingjiang Zhou Zheng-Yu Weng Yayu Wang 《Science Bulletin》 SCIE EI CAS CSCD 2016年第23期1826-1832,共7页
One of the biggest puzzles concerning the cup- rate high temperature superconductors is what determines the maximum transition temperature (Tc,max), which varies from less than 30 to above 130 K in different compoun... One of the biggest puzzles concerning the cup- rate high temperature superconductors is what determines the maximum transition temperature (Tc,max), which varies from less than 30 to above 130 K in different compounds. Despite this dramatic variation, a robust trend is that within each family, the double-layer compound always has higher Tc,max than the single-layer counterpart. Here we use scanning tunneling microscopy to investigate the electronic structure of four cuprate parent compounds belonging to two different families. We find that within each family, the double layer compound has a much smaller charge transfer gap size (ACT), indicating a clear anticorrelation between AcT and Tc,max. These results suggest that the charge transfer gap plays a key role in the superconducting physics of cuprates, which shed important new light on the high To mechanism from doped Mott insulator perspective. 展开更多
关键词 CUPRATES Mot insulator Charge transfer gap - Maximum transition temperature Scanning tunneling microscopy
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Imaging the atomic-scale electronic states induced by a pair of hole dopants in Ca_(2)CuO_(2)Cl_(2) Mott insulator
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作者 Haiwei Li Shusen Ye +2 位作者 Jianfa Zhao Changqing Jin Yayu Wang 《Science Bulletin》 SCIE EI CSCD 2021年第14期1395-1400,M0003,共7页
We use scanning tunneling microscopy to visualize the atomic-scale electronic states induced by a pair of hole dopants in Ca_(2)CuO_(2)Cl_(2)parent Mott insulator of cuprates.We find that when the two dopants approach... We use scanning tunneling microscopy to visualize the atomic-scale electronic states induced by a pair of hole dopants in Ca_(2)CuO_(2)Cl_(2)parent Mott insulator of cuprates.We find that when the two dopants approach each other,the transfer of spectral weight from high energy Hubbard band to low energy ingap state creates a broad peak and nearly V-shaped gap around the Fermi level.The peak position shows a sudden drop at distance around 4 a_(0)and then remains almost constant.The in-gap states exhibit peculiar spatial distributions depending on the configuration of the two dopants relative to the underlying Cu lattice.These results shed important new lights on the evolution of low energy electronic states when a few holes are doped into parent cuprates. 展开更多
关键词 CUPRATES Mott insulator Charge transfer gap Impurity state Scanning tunneling microscopy
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