期刊文献+
共找到3篇文章
< 1 >
每页显示 20 50 100
Materials,processes,devices and applications of magnetoresistive random access memory
1
作者 Meiyin Yang Yan Cui +1 位作者 Jingsheng Chen Jun Luo 《International Journal of Extreme Manufacturing》 2025年第1期277-306,共30页
Magnetoresistive random access memory(MRAM)is a promising non-volatile memory technology that can be utilized as an energy and space-efficient storage and computing solution,particularly in cache functions within circ... Magnetoresistive random access memory(MRAM)is a promising non-volatile memory technology that can be utilized as an energy and space-efficient storage and computing solution,particularly in cache functions within circuits.Although MRAM has achieved mass production,its manufacturing process still remains challenging,resulting in only a few semiconductor companies dominating its production.In this review,we delve into the materials,processes,and devices used in MRAM,focusing on both the widely adopted spin transfer torque MRAM and the next-generation spin-orbit torque MRAM.We provide an overview of their operational mechanisms and manufacturing technologies.Furthermore,we outline the major hurdles faced in MRAM manufacturing and propose potential solutions in detail.Then,the applications of MRAM in artificial intelligent hardware are introduced.Finally,we present an outlook on the future development and applications of MRAM. 展开更多
关键词 spin transfer torque-magnetoresistive random access memory(STT-MRAM) spin-orbit torque(SOT)MRAM materials for MRAM field-free writing of SOT-MRAM MRAM process artificial intelligence
在线阅读 下载PDF
Performance analysis of STT-RAM with cross shaped free layer using Heusler alloys
2
作者 Tangudu Bharat Kumar Bahniman Ghosh +1 位作者 Bhaskar Awadhiya Ankit Kumar Verma 《Journal of Semiconductors》 EI CAS CSCD 2016年第1期47-50,共4页
We have investigated the performance of a spin transfer torque random access memory (STT-RAM) cell with a cross shaped Heusler compound based free layer using micromagnetic simulations. We have designed a free layer... We have investigated the performance of a spin transfer torque random access memory (STT-RAM) cell with a cross shaped Heusler compound based free layer using micromagnetic simulations. We have designed a free layer using a Cobalt based Heusler compound. Simulation results clearly show that the switching time from one state to the other state has been reduced, also it has been found that the critical switching current density (to switch the magnetization of the free layer of the STT RAM cell) is reduced. 展开更多
关键词 spin transfer torque random access memory (STT-MRAM) micromagnetic simulation Heusler com-pound switching time critical switching current density
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部