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Characteristic finite difference fractional step methods for three-dimensional semiconductor device of heat conduction 被引量:4
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作者 YUAN Yirang Institute of Mathematics. Shandong University, Jinan 250100, China 《Chinese Science Bulletin》 SCIE EI CAS 2000年第2期125-131,共7页
The mathematical model of the semiconductor device of heat conduction has been described by a system of four equations. The optimal order estimates in L2 norm are derived for the error in the approximates solution, pu... The mathematical model of the semiconductor device of heat conduction has been described by a system of four equations. The optimal order estimates in L2 norm are derived for the error in the approximates solution, putting fotward a kind of characteristic finite difference fractional step methods. 展开更多
关键词 semiconductor device THREE-DIMENSIONAL heat conduction parallel CHARACTERISTIC tinite DIFFERENCES FRACTIONAL STEPS L2 error estimate.
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