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1
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The Characteristic of Threading Dislocation in Different Structures GaN Films Grown by MOCVD |
Min Lu, Zilan Li, Zhijian Yang, Zonghui Li, Bei Zhang, Guoyi Zhang Research Center for Wide-Band Semiconductor materials, Peking University, Beijing 100871 P.R.China
|
《光学学报》
EI
CAS
CSCD
北大核心
|
2003 |
1
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