This paper describes the standardization of the proton-induced x-ray emission（PIXE） technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard refe...This paper describes the standardization of the proton-induced x-ray emission（PIXE） technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials（SRMs） were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 Me V obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.展开更多
Stimulated emission depletion(STED) microscopy is one of far-field optical microscopy techniques that can provide sub-diffraction spatial resolution. The spatial resolution of the STED microscopy is determined by the ...Stimulated emission depletion(STED) microscopy is one of far-field optical microscopy techniques that can provide sub-diffraction spatial resolution. The spatial resolution of the STED microscopy is determined by the specially engineered beam profile of the depletion beam and its power. However, the beam profile of the depletion beam may be distorted due to aberrations of optical systems and inhomogeneity of a specimen's optical properties, resulting in a compromised spatial resolution. The situation gets deteriorated when thick samples are imaged. In the worst case, the severe distortion of the depletion beam profile may cause complete loss of the superresolution effect no matter how much depletion power is applied to specimens. Previously several adaptive optics approaches have been explored to compensate aberrations of systems and specimens. However, it is difficult to correct the complicated high-order optical aberrations of specimens. In this report, we demonstrate that the complicated distorted wavefront from a thick phantom sample can be measured by using the coherent optical adaptive technique. The full correction can effectively maintain and improve spatial resolution in imaging thick samples.展开更多
文摘This paper describes the standardization of the proton-induced x-ray emission（PIXE） technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials（SRMs） were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 Me V obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.
基金National Basic Research Program of China(2015CB352005)National Natural Science Foundation of China(NSFC)(61378091,61404123,61505118,61505121,61525503)+5 种基金China Postdoctoral Science Foundation(2014M55226)Natural Science Foundation of Guangdong Province(2014A030312008)Hong Kong,Macao and Taiwan cooperation innovation platform&major projects of international cooperation in Colleges and Universities in Guangdong Province(2015KGJHZ002)National Institute of General Medical Sciences(NIGMS)(P20GM103499,R21GM104683)National Science Foundation(NSF)(1539034)Shenzhen Basic Research Project(JCYJ20150930104948169,GJHZ20160226202139185,JCYJ20160328144746940)
文摘Stimulated emission depletion(STED) microscopy is one of far-field optical microscopy techniques that can provide sub-diffraction spatial resolution. The spatial resolution of the STED microscopy is determined by the specially engineered beam profile of the depletion beam and its power. However, the beam profile of the depletion beam may be distorted due to aberrations of optical systems and inhomogeneity of a specimen's optical properties, resulting in a compromised spatial resolution. The situation gets deteriorated when thick samples are imaged. In the worst case, the severe distortion of the depletion beam profile may cause complete loss of the superresolution effect no matter how much depletion power is applied to specimens. Previously several adaptive optics approaches have been explored to compensate aberrations of systems and specimens. However, it is difficult to correct the complicated high-order optical aberrations of specimens. In this report, we demonstrate that the complicated distorted wavefront from a thick phantom sample can be measured by using the coherent optical adaptive technique. The full correction can effectively maintain and improve spatial resolution in imaging thick samples.
