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Improvement of the Open Circuit Voltage of CZTSe Thin-Film Solar Cells by Surface Sulfurization Using SnS 被引量:2
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作者 孙顶 葛阳 +6 位作者 许盛之 张力 李宝璋 王广才 魏长春 赵颖 张晓丹 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第12期160-162,共3页
The objective of this study is to find an effective method to improve Voc without Jsc loss for Cu2ZnSnSe4 (CZTSe) thin film solar cells, which have been fabricated by the one step co-evaporation technique. Surface s... The objective of this study is to find an effective method to improve Voc without Jsc loss for Cu2ZnSnSe4 (CZTSe) thin film solar cells, which have been fabricated by the one step co-evaporation technique. Surface sulfurization of CZTSe thin films is carried out by using one technique that does not utilize toxic H2S gas; a sequential evaporation of SnS after CZTSe deposition and the annealing of CZTSe thin films in selenium vapor. A Cu2ZnSn(S, Se)4 (CZTSSe) thin layer is grown on the surface of the CZTSe thin film after the annealing. The conversion efficiency of the completed device is improved due to the enhancement of Voc, which could be attributed to the formation of a hole-recombination barrier at the surface or the passivation of the surface and grain boundary by S incorporation. 展开更多
关键词 Improvement of the Open circuit Voltage of CZTSe Thin-Film Solar Cells by surface Sulfurization Using SnS
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A novel wide-range precision instrument for measuring three-dimensional surface topography
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作者 杨旭东 《Journal of Chongqing University》 CAS 2008年第1期52-57,共6页
We developed a measuring instrument that had wide range, high precision, small measuring touch force. The instrument for three-dimensional (3D) surface topography measurement was composed of a high precision displacem... We developed a measuring instrument that had wide range, high precision, small measuring touch force. The instrument for three-dimensional (3D) surface topography measurement was composed of a high precision displacement sensor based on the Michelson interference principle, a 3D platform based on vertical scanning, a measuring and control circuit, and an industrial control computer. It was a closed loop control system, which changed the traditional moving stylus scanning style into a moving platform scanning style. When the workpiece was measured, the lever of the displacement sensor returned to the balanced position in every sample interval according to the zero offset of the displacement sensor. The non-linear error caused by the rotation of the lever was, therefore, very small even if the measuring range was wide. The instrument can measure the roughness and the profile size of a curved surface. 展开更多
关键词 instrument circuit surface topography measurement error wide range precision instrument displacement sensor 3D platform
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