Pattem imprinting in deep sub-micron static random access memories （SRAMs） during total dose irradiation is inves- tigated in detail. As the dose accumulates, the data pattern of memory cells loading during irradiat...Pattem imprinting in deep sub-micron static random access memories （SRAMs） during total dose irradiation is inves- tigated in detail. As the dose accumulates, the data pattern of memory cells loading during irradiation is gradually imprinted on their background data pattern. We build a relationship between the memory cell＇s static noise margin （SNM） and the background data, and study the influence of irradiation on the probability density function of ASNM, which is the difference between two data sides＇ SNMs, to discuss the reason for pattern imprinting. Finally, we demonstrate that, for micron and deep sub-micron devices, the mechanism of pattern imprinting is the bias-dependent threshold shift of the transistor, but for a deep sub-micron device the shift results from charge trapping in the shallow trench isolation （STI） oxide rather than from the gate oxide of the micron-device.展开更多
Pseudo-random sequences with long period, low correlation, high linear complexity, and uniform distribution of bit patterns are widely used in the field of information security and cryptography. This paper proposes an...Pseudo-random sequences with long period, low correlation, high linear complexity, and uniform distribution of bit patterns are widely used in the field of information security and cryptography. This paper proposes an approach for generating a pseudo-random multi-value sequence (including a binary sequence) by utilizing a primitive polynomial, trace function, and k-th power residue symbol over the sub extension field. All our previous sequences are defined over the prime field, whereas, proposed sequence in this paper is defined over the sub extension field. Thus, it’s a new and innovative perception to consider the sub extension field during the sequence generation procedure. By considering the sub extension field, two notable outcomes are: proposed sequence holds higher linear complexity and more uniform distribution of bit patterns compared to our previous work which defined over the prime field. Additionally, other important properties of the proposed multi-value sequence such as period, autocorrelation, and cross-correlation are theoretically shown along with some experimental results.展开更多
文摘Pattem imprinting in deep sub-micron static random access memories （SRAMs） during total dose irradiation is inves- tigated in detail. As the dose accumulates, the data pattern of memory cells loading during irradiation is gradually imprinted on their background data pattern. We build a relationship between the memory cell＇s static noise margin （SNM） and the background data, and study the influence of irradiation on the probability density function of ASNM, which is the difference between two data sides＇ SNMs, to discuss the reason for pattern imprinting. Finally, we demonstrate that, for micron and deep sub-micron devices, the mechanism of pattern imprinting is the bias-dependent threshold shift of the transistor, but for a deep sub-micron device the shift results from charge trapping in the shallow trench isolation （STI） oxide rather than from the gate oxide of the micron-device.
文摘Pseudo-random sequences with long period, low correlation, high linear complexity, and uniform distribution of bit patterns are widely used in the field of information security and cryptography. This paper proposes an approach for generating a pseudo-random multi-value sequence (including a binary sequence) by utilizing a primitive polynomial, trace function, and k-th power residue symbol over the sub extension field. All our previous sequences are defined over the prime field, whereas, proposed sequence in this paper is defined over the sub extension field. Thus, it’s a new and innovative perception to consider the sub extension field during the sequence generation procedure. By considering the sub extension field, two notable outcomes are: proposed sequence holds higher linear complexity and more uniform distribution of bit patterns compared to our previous work which defined over the prime field. Additionally, other important properties of the proposed multi-value sequence such as period, autocorrelation, and cross-correlation are theoretically shown along with some experimental results.
