期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching
1
作者 Yu Chen Saimeng Li +3 位作者 Zhibang Shen Chunlong Sun Jintao Feng Long Ye 《Science China Materials》 SCIE EI CAS CSCD 2024年第12期3917-3924,共8页
The advancement in grazing incidence X-ray scattering(GIWAXS)techniques at synchrotron radiation facilities has significantly deepened our understanding of semiconducting polymers.However,investigation of ultrathin po... The advancement in grazing incidence X-ray scattering(GIWAXS)techniques at synchrotron radiation facilities has significantly deepened our understanding of semiconducting polymers.However,investigation of ultrathin polymer films under tensile conditions poses challenge,primarily due to limitations associated with the lack of suitable sample preparation methods and new stretching devices.This study addresses these limitations by designing and developing an in-situ temperature-controllable stretching sample stage,which enables real-time structural measurements of ultrathin polymer films at Beijing Synchrotron Radiation Facility.In particular,we report,for the first time,in-situ GIWAXS results of representative semiconducting polymer thin films under variable-temperature stretching.This research has overcome the limitations imposed by sample constraints,thus facilitating the achievement of valuable insights into the behavior of ultrathin polymer films under tensile conditions.Distinct changes in the molecular ordering and packing within the polymer thin films as a result of increasing applied strain and temperature have been uncovered.This study promotes future developments in the field,thus enabling the design and optimization of intrinsically stretchable electronic devices and other technologically relevant applications. 展开更多
关键词 semiconducting polymers ultrathin films grazing incidence X-ray scattering stretching device strain-induced microstructural evolution
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部