This paper describes the standardization of the proton-induced x-ray emission（PIXE） technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard refe...This paper describes the standardization of the proton-induced x-ray emission（PIXE） technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials（SRMs） were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 Me V obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.展开更多
A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable f...A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable for the analysis of all elements with 11 【 Z 【 92. NBS reference materials were analyzed to provide the experimental test of TSPIXE program.展开更多
文摘This paper describes the standardization of the proton-induced x-ray emission（PIXE） technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials（SRMs） were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 Me V obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.
基金The Project Supported by National Natural Science Foundation of China
文摘A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable for the analysis of all elements with 11 【 Z 【 92. NBS reference materials were analyzed to provide the experimental test of TSPIXE program.
