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Void Formation Analysis in the Molded Underfill Process for Flip-Chip Packaging
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作者 Ian Hu Tzu-Chun Hung +2 位作者 Mu-Heng Zhou Heng-Sheng Lin Dao-Long Chen 《Computers, Materials & Continua》 2025年第7期537-551,共15页
Flip-chip technology is widely used in integrated circuit(IC)packaging.Molded underfill transfer molding is the most common process for these products,as the chip and solder bumps must be protected by the encapsulatin... Flip-chip technology is widely used in integrated circuit(IC)packaging.Molded underfill transfer molding is the most common process for these products,as the chip and solder bumps must be protected by the encapsulating material to ensure good reliability.Flow-front merging usually occurs during the molding process,and air is then trapped under the chip,which can form voids in the molded product.The void under the chip may cause stability and reliability problems.However,the flow process is unobservable during the transfer molding process.The engineer can only check for voids in the molded product after the process is complete.Previous studies have used fluid visualization experiments and developed computational fluid dynamics simulation tools to investigate this issue.However,a critical gap remains in establishing a comprehensive three-dimensional model that integrates two-phase flow,accurate venting settings,and fluid surface tension for molded underfill void evaluation—validated by experimental fluid visualization.This study aims to address this gap in the existing literature.In this study,a fluid visualization experiment was designed to simulate the transfer molding process,allowing for the observation of flow-front merging and void formation behaviors.For comparison,a three-dimensional mold flow analysis was also performed.It was found that the numerical simulation of the trapped air compression process under the chip was more accurate when considering the capillary force.The effect of design factors is evaluated in this paper.The results show that the most important factors for void size are fluid viscosity,the gap height under the chip,transfer time,contact angle between the fluid and the contact surfaces,and transfer pressure.Specifically,a smaller gap height beneath the chip aggravates void formation,while lower viscosity,extended transfer time,reduced contact angle,and increased transfer pressure are effective in minimizing void size.The overall results of this study will be useful for product and process design in selecting appropriate solutions for IC packaging,particularly in the development of void-free molded-underfill flip-chip packages.These findings support the optimization of industrial packaging processes in semiconductor manufacturing by guiding material selection and process parameters,ultimately enhancing package reliability and yield. 展开更多
关键词 Flip chip transfer molding molded underfill void formation capillary force
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Prediction of stress concentration near voids using crystal plasticity modelling
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作者 Jiaxuan Wang Han Wu +2 位作者 Rou Du Hansong Ma Xiaoming Liu 《Acta Mechanica Sinica》 2025年第11期58-72,共15页
Voids play an important role in the fatigue behaviour of polycrystal materials.In this paper,the effects of three factors affecting the stress concentration factors(SCFs)near voids,i.e.,size,depth,and applied load,are... Voids play an important role in the fatigue behaviour of polycrystal materials.In this paper,the effects of three factors affecting the stress concentration factors(SCFs)near voids,i.e.,size,depth,and applied load,are investigated by employing crystal plasticity constitutive models in polycrystal bulks.The results indicate that SCF is dominated by the void size,while void depth and stress level play secondary roles.The SCF fluctuates by the orientation differences among grains and increases with increasing the size of the void.Finally,based on sensitivity examination of orientations and configurations of grains sur-rounding the void,an empirical multivariable-coupled formula is proposed to assess SCF near voids considering anisotropy,and the presented model is in good agreement with the simulation results. 展开更多
关键词 voids Stress concentration factor Crystal plasticity Misorientation variation Multivariable empirical formula
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Harnessing sediment voids of low-grade salt mines for compressed air energy storage:Experimental and theoretical insights
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作者 Qihang Li Wei Liu +5 位作者 Liangliang Jiang Yiwen Ju Aliakbar Hassanpouryouzband Guimin Zhang Xiangzhao Kong Jun Xu 《International Journal of Mining Science and Technology》 2025年第8期1303-1322,共20页
Renewable energy storage technologies are critical for transitioning to sustainable energy systems,with salt caverns playing a significant role in large-scale solutions.In water-soluble mining of low-grade salt format... Renewable energy storage technologies are critical for transitioning to sustainable energy systems,with salt caverns playing a significant role in large-scale solutions.In water-soluble mining of low-grade salt formations,insoluble impurities and interlayers detach during salt dissolution and accumulate as sediment at the cavern base,thereby reducing the storage capacity and economic viability of salt cavern gas storage(SCGS).This study investigates sediment formation mechanisms,void distribution,and voidage in the Huai'an low-grade salt mine,introducing a novel self-developed physical simulation device for two butted-well horizontal(TWH)caverns that replicates compressed air injection and brine discharge.Experiments comparing“one injection and one discharge”and“two injections and one discharge”modes revealed that(1)compressed air effectively displaces brine from sediment voids,(2)a 0.5 MPa injection pressure corresponds to a 10.3 MPa operational lower limit in practice,aligning with field data,and(3)sediment voidage is approximately 46%,validated via air-brine interface theory.The“two injections and one discharge”mode outperformed in both discharge volume and rate.Additionally,a mathematical model for brine displacement via compressed air was established.These results provide foundational insights for optimizing compressed air energy storage(CAES)in low-grade salt mines,advancing their role in renewable energy integration. 展开更多
关键词 Salt cavern Sediment voids CAES Energy storage Physical experiment Low-grade salt mines
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Voids and cracks detection in bulk superconductors through magnetic field and displacement signals
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作者 Dongming An Pengpeng Shi Xiaofan Gou 《Acta Mechanica Sinica》 2025年第5期148-161,共14页
Large-grain REBa_(2)Cu_(3)O_(7-δ)(REBCO,RE=rare earth)bulk superconductors offer promising magnetic field trapping capabilities due to their high critical current density,making them ideal for many important applicat... Large-grain REBa_(2)Cu_(3)O_(7-δ)(REBCO,RE=rare earth)bulk superconductors offer promising magnetic field trapping capabilities due to their high critical current density,making them ideal for many important applications such as trapped field magnets.However,for such large-grain superconductor bulks,there are lots of voids and cracks forming during the process of melting preparation,and some of them can be up to hundreds of microns or even millimeters in size.Consequently,these larger size voids/cracks pose a great threat to the strength of the bulks due to the inherent brittleness of superconductor REBCO materials.In order to ensure the operational safety of related superconducting devices with bulk superconductors,it is firstly important to accurately detect these voids/cracks in them.In this paper,we proposed a method for quantitatively evaluating multiple voids/cracks in bulk superconductors through the magnetic field and displacement response signals at superconductor bulk surface.The proposed method utilizes a damage index constructed from the magnetic field signals and displacement responses to identify the number and preliminary location of multiple defects.By dividing the detection area into subdomains and combining the magnetic field signals with displacement responses within each subdomain,a particle swarm algorithm was employed to evaluate the location and size parameters of the defects.In contrast to other evaluation methods using only magnetic field or displacement response signals,the combined evaluation method using both signals can identify the number of cracks effectively.Numerical studies demonstrate that the morphology of voids and cracks reconstructed using the proposed algorithm ideally matches real defects and is applicable to cases where voids and cracks coexist.This study provides a theoretical basis for the quantitative detection of voids/cracks in bulk superconductors. 展开更多
关键词 Bulk superconductor Defect detection Multiple voids and cracks Damage index Particle swarm optimization
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Revealing crystal defects induced Kirkendall voiding in Cu/Sn solder joints
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作者 Qi Zhang Zhiqiang Zhang +7 位作者 Fangyuan Zeng Wenjie Li Jinhao Liu Shubo Ai Yun Zheng Zhe Li Huaiyu Shao Zhi-Quan Liu 《Rare Metals》 2025年第9期6643-6660,共18页
Kirkendall voids(KVs)at the Cu/Sn interface are a typical failure in integrated circuits,leading to solder joint cracking and electrical disconnection.Although the formation of KVs has been attributed to the differenc... Kirkendall voids(KVs)at the Cu/Sn interface are a typical failure in integrated circuits,leading to solder joint cracking and electrical disconnection.Although the formation of KVs has been attributed to the difference in atomic diffusion rates at the Cu/Sn interface,the role of Cu intrinsic"quality"parameters(crystal defects)in this process remains unclear.This work systematically investigated the effects of Cu crystal defects on KVs:Cu substrates with different lattice defects and grain boundaries were prepared using proprietary electrodeposition additives,and the number of defects was quantitatively characterized by micro-strain,geometric dislocation density,and geometric phase analysis.The thermal aging experiments further showed that the formation of intermetallic compounds and KVs was related to crystal defect energy.When the grain boundary energy was higher than the lattice energy,the additional driving force resulted in short-circuit diffusion,causing local Cu depletion and voids.The lowcrystal-defect samples maintained the local Cu/Sn interdiffusion equilibrium,resulting in fewer voids after 1000 h.This study emphasizes that regulating the crystal defects can reduce KVs and provides a new insight for improving the integrated solder joint's reliability. 展开更多
关键词 Cu electrodeposition Cu/Sn solderability Microstructure engineering Crystal defects Kirkendall voids
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Molecular Dynamics Study on the Interactions of 1/2[110]Edge Dislocations with Voids and Ni_(3)Al Precipitates in FCC Ni
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作者 Wendong Cui Junfeng Nie +1 位作者 Pandong Lin Lei He 《Acta Mechanica Solida Sinica》 2025年第1期1-13,共13页
Nickel-based alloys are the primary structural materials in steam generators of high-temperature gas reactors.To understand the irradiation effect of nickel-based alloys,it is necessary to examine dislocation movement... Nickel-based alloys are the primary structural materials in steam generators of high-temperature gas reactors.To understand the irradiation effect of nickel-based alloys,it is necessary to examine dislocation movement and its interaction with irradiation defects at the microscale.Hardening due to voids and Ni_(3)Al precipitates may significantly impact irradiation damage in nickel-based alloys.This paper employs the molecular dynamics method to analyze the interaction between edge dislocations and irradiation defects(void and Ni_(3)Al precipitates)in face-centered cubic nickel.The effects of temperature and defect size on the interaction are also explored.The results show that the interaction process of the edge dislocation and irradiation defects can be divided into four stages:dislocation free slip,dislocation attracted,dislocation pinned,and dislocation unpinned.Interaction modes include the formation of stair-rod dislocations and the climbing of extended dislocation bundles for voids,as well as the generation of stair-rod dislocation and dislocation shear for precipitates.Besides,the interactions of edge dislocations with voids and Ni_(3)Al precipitates are strongly influenced by temperature and defect size. 展开更多
关键词 void Ni_(3)Al precipitate Nickel Edge dislocation Molecular dynamics
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基于VOID词表的数据集及链接语义关系分析 被引量:2
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作者 贾君枝 马文雯 《情报科学》 CSSCI 北大核心 2020年第10期97-103,共7页
【目的/意义】VOID词表作为元数据词表,对于研究关联数据资源的描述、组织、发布、检索、利用等具有重要意义。【方法/过程】从VOID词表中数据集的构成以及VOID词表中的链接语义关系两方面进行分析。归纳了VOID词表的属性、VOID词表中... 【目的/意义】VOID词表作为元数据词表,对于研究关联数据资源的描述、组织、发布、检索、利用等具有重要意义。【方法/过程】从VOID词表中数据集的构成以及VOID词表中的链接语义关系两方面进行分析。归纳了VOID词表的属性、VOID词表中数据集的主题方向、发布机构、数据集构成的链接语义网络的特点以及链接谓词类型、数据集使用词表的具体情况和共现网络的链接特点。【结果/结论】数据集构成的链接网络中语义关系多数为等同关系,且共现网络中节点与节点之间的联系不够紧密。对语义链接关系进行分析促进了用户对VOID词表的应用以及相关问题的进一步思考、探索和解决。 展开更多
关键词 void词表 链接语义网络 关联数据
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A Model on the Void Fraction in Liquid Slugs for Vertical Slug Flow
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作者 夏国栋 张少华 +2 位作者 魏宸官 周芳德 胡明胜 《Journal of Beijing Institute of Technology》 EI CAS 1999年第1期43-48,共6页
Aim To develop a hydrodynamic model on the void fraction in liquid slugs for gas liquid slug flow in vertical tubes. Methods Developing the model by considering the gas exchange between the Taylor bubble and the fo... Aim To develop a hydrodynamic model on the void fraction in liquid slugs for gas liquid slug flow in vertical tubes. Methods Developing the model by considering the gas exchange between the Taylor bubble and the following liquid slug. Results Some experimental data are obtained to check the model. In comparison with previous published results, the predictions from this model are better and in good agreement with the experimental data. The error is within ±20%. Conclusion The proposed model can correctly predict the void fraction in liquid slugs for gas liquid two phase slug flow in vertical tubes. 展开更多
关键词 gas liquid two phase flow liquid slug void fraction
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Void defect detection in BGA solder joints using mathematical morphology
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作者 张俊生 王明泉 +2 位作者 王玉 王军 郭晋秦 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2017年第2期199-204,共6页
Voids are one of the major defects in ball grid array (BGA) solder joints due to a large amount of outgassing flux that gets entrapped during reflow. X-ray nondestructive machines are used to make voids visible ... Voids are one of the major defects in ball grid array (BGA) solder joints due to a large amount of outgassing flux that gets entrapped during reflow. X-ray nondestructive machines are used to make voids visible as lighter areas inside the solder joints in X-ray images for detection However, it has always been difficult to analyze this problem automatically because of some challenges such as noise, inconsistent lighting and void-like artifacts. This study realized accurate extraction and automatic a-nalysis of void defects in solder joints by adopting a technical proposal, in which Otsu algorithm was used to segment solder balls and void defects were extracted through opening and closing operations and top-hat transformation in mathematical mor-phology. Experimental results show that the technical proposal mentioned here has good robustness and can be applied in the detection of voids in BGA solder joints. 展开更多
关键词 ball grid array (BGA) void defect X-RAY OTSU mathematical morphology
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掺杂剂种类对大直径直拉硅单晶中void微缺陷的影响
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作者 郝秋艳 孙文秀 +2 位作者 刘彩池 张建强 姚素英 《南开大学学报(自然科学版)》 CAS CSCD 北大核心 2006年第6期64-67,共4页
研究了掺杂剂原子种类及快速热处理技术对大直径直拉硅单晶中空洞型微缺陷密度的影响.实验结果发现,掺入半径较大杂质原子的硅片,空洞型微缺陷密度相对较高,掺入半径较小杂质原子的硅片,空洞型微缺陷的密度相对较低.高温快速热处理后,... 研究了掺杂剂原子种类及快速热处理技术对大直径直拉硅单晶中空洞型微缺陷密度的影响.实验结果发现,掺入半径较大杂质原子的硅片,空洞型微缺陷密度相对较高,掺入半径较小杂质原子的硅片,空洞型微缺陷的密度相对较低.高温快速热处理后,硅片中FPD s的密度都有很大程度降低,而A r气氛退火对vo id微缺陷密度的影响要优于N2气氛.轻掺B硅片在O2气氛退火后FPD s密度下降最多,而重掺Sb硅片在O2气氛退火后FPD s密度下降最少. 展开更多
关键词 CZSI 空洞型微缺陷 FPDS 快速热处理
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浅谈C/C++中的void
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作者 申晋祥 《雁北师范学院学报》 2006年第2期29-31,共3页
对C语言中void关键字的含义进行了解释,并详述了void及void指针类型的使用方法和技巧.
关键词 void 含义 用法
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基于器件结构与工艺优化的高可靠性eFuse设计
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作者 孙豪赛 赖振安 《半导体技术》 北大核心 2026年第1期63-67,共5页
电编程熔丝(eFuse)广泛应用于手机片上系统(SoC)、汽车微控制器(MCU)、人工智能(AI)芯片中,其编程后存在电迁移不完全、阴极镍残留等问题,且高温使导电层NiSi形貌退化产生空洞,初始电阻增大,从而导致eFuse烧写不充分,可靠性降低。基于... 电编程熔丝(eFuse)广泛应用于手机片上系统(SoC)、汽车微控制器(MCU)、人工智能(AI)芯片中,其编程后存在电迁移不完全、阴极镍残留等问题,且高温使导电层NiSi形貌退化产生空洞,初始电阻增大,从而导致eFuse烧写不充分,可靠性降低。基于器件结构和工艺提出了优化方案,器件阴极采用面积更小的细长条结构,降低镍含量以缩短迁移时间;沉积NiSi时采用Pt原子数分数为10%的金属靶材,以更有效地抑制高阻态NiSi_(2);同时在钨化学机械抛光后省略退火步骤,降低高温造成的导电层不稳定。测试结果显示,改进方案下eFuse初始电阻标准差较传统方案降低40%,在标准电压-20%~-10%下,烧写后电阻标准差降低85%,电阻中位数可达600 kΩ,具有较高的一致性与可靠性。 展开更多
关键词 电编程熔丝(eFuse) NISI Ni残留 NiSi空洞 电迁移 可靠性
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隧道二衬防脱空监管技术研究与应用
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作者 齐浩 《价值工程》 2026年第2期116-119,共4页
由于隧道衬砌施工采取整体式台车,在实际操作中,却因种种主观和客观因素,在二衬拱顶结构部位埋下了隐患,空洞与脱空问题频发,成为隧道施工质量的一大顽疾。事后对这些二衬拱顶出现空洞、脱空,事后的补强整改工作便成为一项艰巨的任务。... 由于隧道衬砌施工采取整体式台车,在实际操作中,却因种种主观和客观因素,在二衬拱顶结构部位埋下了隐患,空洞与脱空问题频发,成为隧道施工质量的一大顽疾。事后对这些二衬拱顶出现空洞、脱空,事后的补强整改工作便成为一项艰巨的任务。整改施工工期较长,需要投入大量的人力、物力和时间成本。脱空部位的位置特殊,施工空间狭窄,施工难度极大,整改质量难以得到有效保证。这些空洞、脱空问题如不妥善解决,还会给隧道的后期运营带来安全隐患,影响隧道的使用寿命和稳定性。通过防脱空监管设备对翠屏山隧道二次衬砌施工掌握的大量数据来看,二次衬砌施工迎来了破局的曙光,防脱空监管设备宛如一位精密的“健康监测医生”,为隧道二衬拱顶施工质量保驾护航,成为攻克空洞、脱空难题的关键利器,确实提高了二衬工程的质量。 展开更多
关键词 防脱空 监管技术 二次衬砌 动态监测
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Effects of binder strength and aggregate size on the compressive strength and void ratio of porous concrete 被引量:24
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作者 P. Chindaprasirt S. Hatanaka +2 位作者 N. Mishima Y. Yuasa T. Chareerat 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2009年第6期714-719,共6页
To test the influence of binder strength, porous concretes with 4 binder strengths between 30.0-135.0 MPa and 5 void ratios between 15%-35% were tested. The results indicated that for the same aggregate, the rates of ... To test the influence of binder strength, porous concretes with 4 binder strengths between 30.0-135.0 MPa and 5 void ratios between 15%-35% were tested. The results indicated that for the same aggregate, the rates of strength reduction due to the increases in void ratio were the same for binders with different strengths. To study the influence of aggregate size, 3 single size aggregates with nominal sizes of 5.0, 13.0 and 20.0 mm (Nos. 7, 6 and 5 according to JIS A 5001) were used to make porous concrete. The strengths of porous concrete are found to be dependent on aggregate size. The rate of strength reduction of porous concrete with small aggregate size is found to be higher than that with larger aggregate size. At the same void ratio, the strength of porous concrete with large aggregate is larger than that with small aggregate. The general equations for porous concrete are related to compressive strength and void ratio for different binder strengths and aggregate sizes. 展开更多
关键词 cement paste porous concrete compressive strength void ratio
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沿空留墙无煤柱开采技术在煤矿大采高工作面中的应用
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作者 郭庆春 《科学技术创新》 2026年第1期87-90,共4页
以高家梁煤矿为例,探究了沿空留墙无煤柱开采技术在煤矿大采高工作面中的应用。为提高沿空留墙的稳定性和承载力,进行留设墙体的受力分析,并探究了顶板块体长度、采空区矸石承载力和实体煤支撑长度等因素对沿空留墙受力的影响,为合理确... 以高家梁煤矿为例,探究了沿空留墙无煤柱开采技术在煤矿大采高工作面中的应用。为提高沿空留墙的稳定性和承载力,进行留设墙体的受力分析,并探究了顶板块体长度、采空区矸石承载力和实体煤支撑长度等因素对沿空留墙受力的影响,为合理确定沿空留墙参数提供了参考。在实际应用中,使用C40混凝土浇筑留设墙体,不仅能解决留设煤柱造成煤炭资源损失的问题,而且加快了巷道掘进速度、保证了井下作业安全,兼顾了经济效益、作业效率和生产安全,沿空留墙技术在该煤矿中的应用效果显著。 展开更多
关键词 煤矿采空区 沿空留墙 柔性模板 巷旁支护
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Influence of Voids on the Tensile Performance of Carbon/epoxy Fabric Laminates 被引量:5
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作者 Hongyan Zhu Baochang Wu +2 位作者 Dihong Li Dongxing Zhang Yuyong Chen 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2011年第1期69-73,共5页
This paper aims at investigating the effect of voids on the tensile properties of [(±45)4/(0,90)/(±45)2] S and [(±45)/0 4/(±45)(0,90)] S composites.Specimens with void contents in the r... This paper aims at investigating the effect of voids on the tensile properties of [(±45)4/(0,90)/(±45)2] S and [(±45)/0 4/(±45)(0,90)] S composites.Specimens with void contents in the range of 0.4% to 9.0% were fabricated from carbon/epoxy fabric.The void content was determined by ultrasonic attenuation and optical image analysis,and microscopic inspection was also used to analyze the shape and size of the voids.The influence of voids on the tensile strength and modulus of both stacking sequence is compared in terms of the size and the shape of the voids.The effect of voids on the initiation and propagation of tensile failure of both stacking sequence composite was investigated. 展开更多
关键词 COMPOSITE void Tensile strength
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A theoretical analysis of the electromigration-induced void morphological evolution under high current density 被引量:7
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作者 Yuexing Wang Yao Yao 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 2017年第5期868-878,共11页
In this work, analysis of electromigration-induced void morphological evolution in solder interconnects is performed based on mass diffusion theory. The analysis is conducted for three typical experimentally observed ... In this work, analysis of electromigration-induced void morphological evolution in solder interconnects is performed based on mass diffusion theory. The analysis is conducted for three typical experimentally observed void shapes: circular, ellipse, and cardioid. Void morphological evolution is governed by the competition between the electric field and surface capillary force. In the developed model, both the electric field and capillary force on the void's surface are solved analytically. Based on the mass conversation principle, the normal velocity on the void surface during diffusion is obtained. The void morphological evolution behavior is investigated, and a physical model is developed to predict void collapse to a crack or to split into sub-voids under electric current. It is noted that when the electric current is being applied from the horizontal direction, a circular void may either move stably along the electric current direction or collapse to a finger shape, depending on the relative magnitude of the electric current and surface capillary force. However, the elliptical-shaped void will elongate along the electric current direction and finally collapse to the finger shape. On the other hand, the cardioid-shaped void could bifurcate into two sub-voids when the electric current reaches a critical value. The theoretical predictions agree well with the experimental observations. 展开更多
关键词 ELECTROMIGRATION Analytical solution void evolution High current density Mass diffusion
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Effect of the Entrained Air Void on Strength and Interfacial Transition Zone of Air-Entrained Mortar 被引量:9
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作者 高辉 ZHANG Xiong ZHANG Yongjuan 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2015年第5期1020-1028,共9页
In order to facilitate the development and application of air entraining agents (AEA) in the high performance concrete, entrained air void structure parameters (air void size range from 10 to 1 600 mu m) of 28 d sifte... In order to facilitate the development and application of air entraining agents (AEA) in the high performance concrete, entrained air void structure parameters (air void size range from 10 to 1 600 mu m) of 28 d sifted mortar were measured by image analysis method. The relationship between the air void size distribution and strength of mortar was studied by methods of grey connection analysis and multiple linear regression analysis. The multiple linear regression equation was established with a correlation coefficient of 0.966. The weight of the affection of hierarchical porosity on the compressive strength ratio was also obtained. In addition, the effect of air voids on the paste-aggregate interfacial transition zone (ITZ) was analyzed by microhardness. The results show that the correlation between different pore size range and the compressive strength is negative. The effect of air void size distribution on 28 days compressive strength is different: under the condition of similar total porosity, with the increase of the porosity of the air void size, ranging from 10 to 200 mu m, and the decrease of the porosity, ranging from 200 to 1 600 mu m, the average air void diameter and mean free spacing are decreased; as well as the width of ITZ. On the contrary, the microhardness of the ITZ is increased while the compressive strength loss is decreased. 展开更多
关键词 air void structure compressive strength interfacial transition zone grey connection linear regression
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Diffusion behavior at void tip and its contributions to void shrinkage during solid-state bonding 被引量:5
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作者 C.Zhang M.Q.Li H.Li 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2018年第8期1449-1454,共6页
Solid-state diffusion bonding is an advanced joining technique, which has been widely used to join similar or dissimilar materials. Generally, it is easy to observe the diffusion behavior during dissimilar bonding, bu... Solid-state diffusion bonding is an advanced joining technique, which has been widely used to join similar or dissimilar materials. Generally, it is easy to observe the diffusion behavior during dissimilar bonding, but for similar bonding the diffusion behavior has yet been observed via experiments. In this study, the diffusion behavior at void tip was firstly observed during similar bonding of stainless steel. Scanning electron microscopy with energy dispersive spectroscopy was used to examine the interface charac- teristic and diffusion behavior. The results showed that a diffusion region was discovered at void tip. Element concentrations of diffusion region were more than those of void region, but less than those of bonded region. This behavior indicated that the diffusion was ongoing at void tip, but the perfect bond has yet formed. The diffusion region was attributed to the interface diffusion from adjacent region to void tip due to the stress gradient along bonding interface. The mass accumulation at void tip transformed the sharp void tip into smooth one at the beginning of void shrinkage, and then resulted in shorter voids. 展开更多
关键词 Stainless steel Micro-void morphology Solid-state bonding void tip Element diffusion
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Simulation of lattice orientation effects on void growth and coalescence by crystal plasticity 被引量:2
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作者 Mei YANG Xianghuai DONG 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2009年第1期40-50,共11页
A three dimensional rate-dependent crystal plasticity model is applied to study the influence of crystal orientation and grain boundary on the void growth and coalescence. The 3D computational model is a unit cell inc... A three dimensional rate-dependent crystal plasticity model is applied to study the influence of crystal orientation and grain boundary on the void growth and coalescence. The 3D computational model is a unit cell including one sphere void or two sphere voids. The results of three different orientations for single crystal and bicrystals are compared. It is found that crystallographic orientation has noticeable influences on the void growth directionvoid shape, and void coalescence of single crystal. The void growth rate of bicrystals depends on the crystallographic orientations and grain boundary direction. 展开更多
关键词 Crystal plasticity void growth void coalescence Lattice orientation BICRYSTAL
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