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Accuracy characterization of Shack-Hartmann sensor with residual error removal in spherical wavefront calibration 被引量:7
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作者 Yi He Mingdi Bao +3 位作者 Yiwei Chen Hong Ye Jinyu Fan Guohua Shi 《Light: Advanced Manufacturing》 2023年第4期55-65,共11页
The widely used Shack-Hartmann wavefront sensor(SHWFS)is a wavefront measurement system.Its measurement accuracy is limited by the reference wavefront used for calibration and also by various residual errors of the se... The widely used Shack-Hartmann wavefront sensor(SHWFS)is a wavefront measurement system.Its measurement accuracy is limited by the reference wavefront used for calibration and also by various residual errors of the sensor itself.In this study,based on the principle of spherical wavefront calibration,a pinhole with a diameter of 1μm was used to generate spherical wavefronts with extremely small wavefront errors,with residual aberrations of 1.0×10^(−4)λRMS,providing a high-accuracy reference wavefront.In the first step of SHWFS calibration,we demonstrated a modified method to solve for three important parameters(f,the focal length of the microlens array(MLA),p,the sub-aperture size of the MLA,and s,the pixel size of the photodetector)to scale the measured SHWFS results.With only three iterations in the calculation,these parameters can be determined as exact values,with convergence to an acceptable accuracy.For a simple SHWFS with an MLA of 128×128 sub-apertures in a square configuration and a focal length of 2.8 mm,a measurement accuracy of 5.0×10^(−3)λRMS was achieved across the full pupil diameter of 13.8 mm with the proposed spherical wavefront calibration.The accuracy was dependent on the residual errors induced in manufacturing and assembly of the SHWFS.After removing these residual errors in the measured wavefront results,the accuracy of the SHWFS increased to 1.0×10^(−3)λRMS,with measured wavefronts in the range ofλ/4.Mid-term stability of wavefront measurements was confirmed,with residual deviations of 8.04×10^(−5)λPV and 7.94×10^(−5)λRMS.This study demonstrates that the modified calibration method for a high-accuracy spherical wavefront generated from a micrometer-scale pinhole can effectively improve the accuracy of an SHWFS.Further accuracy improvement was verified with correction of residual errors,making the method suitable for challenging wavefront measurements such as in lithography lenses,astronomical telescope systems,and adaptive optics. 展开更多
关键词 Shack-Hartmann wavefront sensor spherical wavefront calibration Residual aberration correction High-accuracy measurement of wavefronts
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Measurement.Based Spatial-Consistent Channel Modeling Involving Clusters of Scatterers
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作者 YIN Xuefeng ZHANG Nan +1 位作者 Stephen Wang CHENG Xiang 《ZTE Communications》 2017年第1期28-34,共7页
In this paper,the conventional method of establishing spatial channel models(SCMs)based on measurements is extended by including clusters-of-scatterers(CoSs)that exist along propagation paths.The channel models result... In this paper,the conventional method of establishing spatial channel models(SCMs)based on measurements is extended by including clusters-of-scatterers(CoSs)that exist along propagation paths.The channel models resulted utilizing this new method are applicable for generating channel realizations of reasonable spatial consistency,which is required for designing techniques and systems of the fifth generation wireless communications.The scatterers’locations are estimated from channel measurement data obtained using large-scale antenna arrays through the Space-Alternating Generalized Expectation-Maximization(SAGE)algorithm derived under a spherical wavefront assumption.The stochastic properties of CoSs extracted from real measurement data in an indoor environment are presented. 展开更多
关键词 channel modeling large-scale antenna array spatial consistency space-alternating generalized expectation-maximization(SAGE) algorithm spherical wavefront
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