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Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility 被引量:1
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作者 杨家敏 甘新式 +10 位作者 赵阳 崔明启 朱托 赵屹东 孙丽绢 郑雷 鄢芬 胡智民 韦敏习 张继彦 易荣清 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第1期276-283,共8页
Integral diffraction coefficients of the crystal are the essential data of a crystal spectrometer which is extensively used to measure quantitative x-ray spectra of high temperature plasmas in kilo-electron-volt regio... Integral diffraction coefficients of the crystal are the essential data of a crystal spectrometer which is extensively used to measure quantitative x-ray spectra of high temperature plasmas in kilo-electron-volt region. An experimental method has been developed to measure the integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility. The integral diffraction coefficients of several crystals including polyethylene terephthalate (PET), thallium acid phthalate (T1AP) and rubidium acid phthalate (RAP) crystals have been measured in the x-ray energy range 2100-5600 eV and compared with the calculations of the 'Darwin Prins' and the 'Mosaic' models. It is shown that the integral diffraction coefficients of these crystals are between the calculations of the 'Darwin Prins' and the 'Mosaic' models, but more close to the 'Darwin Prins' model calculations. 展开更多
关键词 integral diffraction coefficient CRYSTAL x-ray spectrum measurement high temperature plasmas
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Comparison between Double Crystals X-ray Diffraction and Micro-Raman Measurement on Composition Determination of High Ge Content Si_(1-x)Ge_(x) Layer Epitaxied on Si Substrate 被引量:1
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作者 Lei ZHAO Yuhua ZUO Buwen CHENG Jinzhong YU Qiming WANG 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2006年第5期651-654,共4页
It is important to acquire the composition of Si1-xGex layer, especially that with high Ge content, epitaxied on Si substrate. Two nondestructive examination methods, double crystals X-ray diffraction (DCXRD) and mi... It is important to acquire the composition of Si1-xGex layer, especially that with high Ge content, epitaxied on Si substrate. Two nondestructive examination methods, double crystals X-ray diffraction (DCXRD) and micro-Raman measurement, were introduced comparatively to determine x value in Si1-xGex layer, which show that while the two methods are consistent with each other when x is low, the results obtained from double crystals X-ray diffraction are not credible due to the large strain relaxation occurring in Si1-xGex layers when Ge content is higher than about 20%. Micro-Raman measurement is more appropriate for determining high Ge content than DCXRD. 展开更多
关键词 Si1-xGex Ge content Composition determination Double crystals X-ray diffraction (DCXRD) Micro-Raman measurement
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Research on the Dark Stripes Extraction Algorithm for Measuring Diameter with Diffraction 被引量:1
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作者 Quan Liu Fenglin Wei 《Optics and Photonics Journal》 2013年第2期53-56,共4页
The optical diffraction is a major means of minute diameter measurements. Since the light intensity of the diffraction fringe, mainly distributed in the central bright stripes, and that will lead to a relatively low S... The optical diffraction is a major means of minute diameter measurements. Since the light intensity of the diffraction fringe, mainly distributed in the central bright stripes, and that will lead to a relatively low SNR for the signal of the senior stripes. The traditional dark stripes extraction algorithm affected greatly by the noise. So this paper presents an algorithm that could effectively eliminate the gross errorcaused by the noise. Than by curve fitting the local signal of the diffraction pattern with the least square principle, the system could achieve a high measurement precision. 展开更多
关键词 diffraction DIAMETER measurement DARK STRIPES EXTRACT Least SQUARES Fitting
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Sub-Diffraction Limit Quantum Metrology for Nanofabrication
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作者 Wenyi Ye Yang Li +10 位作者 Lianwei Chen Mingbo Pu Zheting Meng Yuanjian Huang Hengshuo Guo Xiaoyin Li Yinghui Guo Xiong Li Yun Long Emmanuel Stratakis Xiangang Luo 《Engineering》 2025年第6期96-103,共8页
Optical monitoring of object position and alignment with nanoscale precision is critical for ultra-precision measurement applications,such as micro/nano-fabrication,weak force sensing,and micro-scopic imaging.Traditio... Optical monitoring of object position and alignment with nanoscale precision is critical for ultra-precision measurement applications,such as micro/nano-fabrication,weak force sensing,and micro-scopic imaging.Traditional optical nanometry methods often rely on precision nanostructure fabrication,multi-beam interferometry,or complex post-processing algorithms,which can limit their practical use.In this study,we introduced a simplified and robust quantum measurement technique with an achievable resolution of 2.2 pm and an experimental demonstration of 1 nm resolution,distinguishing it from conventional interferometry,which depended on multiple reference beams.We designed a metasurface substrate with a mode-conversion function,in which an incident Gaussian beam is converted into higher-order transverse electromagnetic mode(TEM)modes.A theoretical analysis,including calculations of the Fisher information,demonstrated that the accuracy was maintained for nanoscale displacements.In conclusion,the study findings provide a new approach for precise alignment and metrology of nanofabrication and other advanced applications. 展开更多
关键词 Nanofabrication Precision measurement diffraction limit Quantum metrology
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Optical fiber sensor by cascading long period fiber grating with FBG for double parameters measurement 被引量:4
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作者 张雯 娄小平 +1 位作者 董明利 祝连庆 《Optoelectronics Letters》 EI 2017年第5期372-375,共4页
An optical fiber sensor for strain and temperature measurement based on long period fiber grating(LPFG) cascaded with fiber Bragg grating(FBG) structure has been proposed and realized both theoretically and experiment... An optical fiber sensor for strain and temperature measurement based on long period fiber grating(LPFG) cascaded with fiber Bragg grating(FBG) structure has been proposed and realized both theoretically and experimentally. Theoretical analysis shows that two microstructures with similar sensitivities cannot be used for double parameters measurement. The LPFG is micromachined by the CO_2 laser, and the FBG is micromachined by the excimer laser. For the validation and comparison, two FBGs and one LPFG are cascaded with three transmission valleys, namely FBG1 valley at 1 536.3 nm, LPFG valley at 1 551.2 nm, and FBG2 valley at 1 577.3 nm. The temperature and strain characteristics of the proposed sensor are measured at 45—70 °C and 250—500 με, respectively. The sensitivity matrix is determined by analyzing wavelength shifts and parameter response characterization of three different dips. The proposed optical fiber sensor based on LPFG cascaded with FBG structure can be efficiently used for double parameters measurement with promising application prospect and great research reference value. 展开更多
关键词 Carbon dioxide lasers diffraction gratings Excimer lasers Fibers LANDFORMS Optical fibers Parameter estimation Temperature measurement
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New terahertz dispersive device for single-shot spectral measurements of terahertz pulse
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作者 巫殷忠 赵宗清 +2 位作者 谷渝秋 魏来 曹磊峰 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第12期329-332,共4页
A new terahertz dispersive device designed for single-shot spectral measurements of broadband terahertz pulses is proposed. With two-dimensional quasi-randomly distributed element design, the device exhibits approxima... A new terahertz dispersive device designed for single-shot spectral measurements of broadband terahertz pulses is proposed. With two-dimensional quasi-randomly distributed element design, the device exhibits approximately the dispersive property of single-order diffraction in far field. Its far-field diffraction pattern is experimentally verified employing a continuous terahertz source centered at 2.52 THz and a pyroelectric focal-plane-array camera, which is in good agreement with the numerical result. The device provides a new approach for direct single-shot spectral measurements of broadband terahertz waves. 展开更多
关键词 TERAHERTZ diffraction single-shot spectral measurement
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A METHOD FOR CORRECTING INTENSITY IN CONTINU-OUS SCANNING X-RAY STRESS MEASUREMENT
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作者 LI Jiabao HANG Zengqiao National Laboratory for Fatigue and Fracture of Materials,Institute of Metal Research,Academia Simca.Shenyang,China HE Jiawen Xi’an Jiaotong University,Xi’an,China 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1992年第12期457-461,共5页
A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorptio... A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorption of pure diffraction intensity.Experimental results revealed this to be a reliable correction method. 展开更多
关键词 X-ray diffraction stress measurement intensity correction peak location
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MODIFICATION OF SEEMANN-BOHLIN METHOD FOR STRESS MEASUREMENT
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作者 YU Ligen BAI Chendong CHEN Hua XU Kewei HE Jiawen Xi’an Jiaotong University,Xi’an,China Research Institute for Strength of Metals,Xi’an Jiaotong University,Xi’an 710049,China 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1993年第11期393-397,共5页
The scattered distribution of the lattice parameters in the Seemann-Bohlin method for stress measurement was discussed.A linear relation can be achieved by modification with the theory deduced from Kroner model.Howeve... The scattered distribution of the lattice parameters in the Seemann-Bohlin method for stress measurement was discussed.A linear relation can be achieved by modification with the theory deduced from Kroner model.However,the Seemann-Bohlin method cannot achieve good accuracy in comparison with the Bragg-Brentauo method,particularly for low stress values. 展开更多
关键词 Seemann-Bohlin diffraction elastic anisotropy stress measurement
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A Universal Blown Film Apparatus for in Situ X-ray Measurements
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作者 Rui Zhang 纪又新 +5 位作者 Qian-lei Zhang Jian-zhu Ju Ali Sarmad Li-fu Li Hao-yuan Zhao 李良彬 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2017年第12期1508-1516,共9页
A setup of blown film machine combined with in situ synchrotron radiation X-ray diffraction measurements and infrared temperature testing is reported to study the structure evolution of polymers during film blowing. T... A setup of blown film machine combined with in situ synchrotron radiation X-ray diffraction measurements and infrared temperature testing is reported to study the structure evolution of polymers during film blowing. Two homemade auto-lifters are constructed and placed under the blown machine at each end of the beamline platform which move up and down with a speed of 0.05 mm/s bearing the 200 kg weight machine. Therefore, structure development and temperature changes as a function of position on the film bubble can be obtained. The blown film machine is customized to be conveniently installed with precise servo motors and can adjust the processing parameters in a wide range. Meanwhile, the air ring has been redesigned in order to track the structure information of the film bubble immediately after the melt being extruded out from the die exit. Polyethylene(PE) is selected as a model system to verify the feasibility of the apparatus and the in situ experimental techniques. Combining structure information provided by the WAXD and SAXS and the actual temperature obtained from the infrared probe, a full roadmap of structure development during film blowing is constructed and it is helpful to explore the molecular mechanism of structure evolution behind the film blowing processing, which is expected to lead to a better understanding of the physics in polymer processing. 展开更多
关键词 Blown film machine Synchrotron radiation X-ray diffraction In situ measurement Structure evolution
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Research on Online Texture Measurements in Metal Rolling Field
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作者 何飞 殷安民 杨荃 《Journal of Shanghai Jiaotong university(Science)》 EI 2012年第6期690-696,共7页
In rolled strip material,the orientation of the crystallites,known as texture,is influenced by various kinds of thermo-mechanical processes,such as casting,plastic deformation,annealing and phase transformation. The m... In rolled strip material,the orientation of the crystallites,known as texture,is influenced by various kinds of thermo-mechanical processes,such as casting,plastic deformation,annealing and phase transformation. The modern industry production requires stable product performance,real-time monitoring and full controlling of the quality.The online texture measurement in metal rolling can be used to real-time monitor the whole process, and then feedback control to the production process can be implied to adjust the process parameters to ensure the stability of the products.The principles,advantages and disadvantages of related detection methods(2D X-ray diffraction,neutron diffraction,laser-ultrasonics and electromagnetic acoustic transducers(EMAT)) and the possibility of online measurement are discussed.Finally,2D X-ray diffraction and laser-ultrasonics are employed on online texture measurement,and the schemes of online texture measurement are proposed. 展开更多
关键词 texture measurement 2D X-ray diffraction laser-ultrasonics electromagnetic acoustic transducers neutron diffraction
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Improved phase-shifting diffraction interferometer for microsphere topography measurements 被引量:1
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作者 刘国栋 卢丙辉 +3 位作者 孙和义 刘炳国 陈凤东 庄志涛 《Chinese Optics Letters》 SCIE EI CAS CSCD 2016年第7期47-50,共4页
In this study, an improved phase-shi^ng diffraction interferometer for measuring the surface topography of a microsphere is developed. A common diode-pumped solid state laser is used as the light source to facilitate ... In this study, an improved phase-shi^ng diffraction interferometer for measuring the surface topography of a microsphere is developed. A common diode-pumped solid state laser is used as the light source to facilitate ap- paratus realization, and a new polarized optical arrangement is designed to filter the bias light for phase-shifting control. A pinhole diffraction self-calibration method is proposed to eliminate systematic errors introduced by optical elements. The system has an adjustable signal contrast and is suitable for testing the surface with low reflectivity. Finally, a spherical ruby probe of a coordinate measuring machine is used as an example tested by the new phase-shifting diffraction interferometer system and the WYKO scanning white light interferometer for experimental comparison. The measured region presents consistent overall topography features, and the resulting peak-to-valley value of 84.43 nm and RMS value of 18.41 nm are achieved. The average roughness coincides with the manufacturer's specification value. 展开更多
关键词 Improved phase-shifting diffraction interferometer for microsphere topography measurements
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The Use of Light Diffracted from Grating Etched onto the Backside Surface of an Atomic Force Microscope Cantilever Increases the Force Sensitivity
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作者 Sergey K. Sekatskii Mounir Mensi +1 位作者 Andrey G. Mikhaylov Giovanni Dietler 《Journal of Surface Engineered Materials and Advanced Technology》 2013年第4期29-35,共7页
A reflecting diffraction grating has been etched onto the backside of a standard cantilever for atomic force microscopy, and the diffracted light has been used to monitor the angular position of the cantilever. It is ... A reflecting diffraction grating has been etched onto the backside of a standard cantilever for atomic force microscopy, and the diffracted light has been used to monitor the angular position of the cantilever. It is shown experimentally that for small angles of incidence and for large reflection angles, the force sensitivity can be improved by few times when an appropriate detection scheme based on the position sensitive (duolateral) detector is used. The first demonstration was performed with a one micron period amplitude diffraction grating onto the backside of an Al-coated cantilever etched by a focused ion beam milling for the experiments in air and an analogous 600 nm-period grating for the experiments in air and in water. 展开更多
关键词 ATOMIC FORCE Microscopy FORCE measurement Sensitivity diffraction GRATING
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Accurate measurement of ultrasonic velocity by eliminating the diffraction effect
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作者 WEI Tingcun(Department of Electrical Engineering, Tohoku University Japan) 《Chinese Journal of Acoustics》 2003年第3期217-221,共5页
The accurate measurement method of ultrasonic velocity by the pulse interference method with eliminating the diffraction effect has been investigated in VHF range experimentally. Two silicate glasses were taken as the... The accurate measurement method of ultrasonic velocity by the pulse interference method with eliminating the diffraction effect has been investigated in VHF range experimentally. Two silicate glasses were taken as the specimens, their frequency dependences of longitudinal velocities were measured in the frequency range 50-350 MHz, and the phase advances of ultrasonic signals caused by diffraction effect were calculated using A. O. Williams' theoretical expression. For the frequency dependences of longitudinal velocities, the measurement results were in good agreement with the simulation ones in which the phase advances were included. It has been shown that the velocity error due to diffraction effect can be corrected very well by this method. 展开更多
关键词 of AS on IT by Accurate measurement of ultrasonic velocity by eliminating the diffraction effect into IS that been
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Synchrotron X-ray diffraction techniques for in situ measurement of hydride formation under several gigapascals of hydrogen pressure
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作者 Hiroyuki Saitoh Akihiko Machida Katsutoshi Aoki 《Chinese Science Bulletin》 SCIE EI CAS 2014年第36期5290-5301,共12页
The high-pressure technique is a fundamental tool for realizing novel phase transitions, chemical reactions, and other exotic phenomena. Hydrogenation is one example of a high-pressure reaction; at high pressures of s... The high-pressure technique is a fundamental tool for realizing novel phase transitions, chemical reactions, and other exotic phenomena. Hydrogenation is one example of a high-pressure reaction; at high pressures of several gigapascals, hydrogen becomes chemically active and reacts with metals and alloys to form hydrides. This paper covers a high-pressure study of the hydrogenation process and the synthesis of hydrides using a cubic-type multi-anvil apparatus. The experimental details of a hydrogenation cell assembly, high-temperature and highpressure generation, and an in situ observation technique are presented. These experiments are conducted with the aid of in situ synchrotron radiation X-ray diffraction measurements operated in an energy-dispersive mode in the conventional manner for time-resolved measurements and a newly developed angle-dispersive mode for observation of the crystal growth process during formation of metal hydrides. Two successful cases of high-pressure hydrogenation are presented: aluminum hydride, Al H3, and an aluminum-based alloy hydride, Al2 Cu Hx, which are potential candidates for hydrogen storage materials. 展开更多
关键词 X射线衍射技术 金属氢化物 原位测量 氢气压力 同步加速器 同步辐射X射线衍射 高压技术 晶体生长过程
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基于针孔点衍射干涉的纳米位移测量方法(封面文章·特邀)
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作者 滕卓卿 禹静 +2 位作者 雷李华 孔明 于航 《红外与激光工程》 北大核心 2025年第12期1-10,共10页
面向超精密加工技术、芯片制造技术等精密制造领域等对纳米级位移测量精度的迫切需求,提出了一种基于针孔球面波干涉条纹分析的高精度纳米位移测量方法。该方法将针孔点衍射产生的理想球面波前与被测反射平面干涉所得同心圆条纹应用于... 面向超精密加工技术、芯片制造技术等精密制造领域等对纳米级位移测量精度的迫切需求,提出了一种基于针孔球面波干涉条纹分析的高精度纳米位移测量方法。该方法将针孔点衍射产生的理想球面波前与被测反射平面干涉所得同心圆条纹应用于法向位移检测。为避免多帧点衍射技术中由于依赖压电陶瓷(Piezoelectric Ceramic,PZT)相移器而带来的温漂和时序同步问题,提出双帧无相移空间域多环条纹自动识别、圆心精确定位,并基于局部极值提取有效环带数据,经过基于正态分布假设的异常值剔除机制后进行平均位移的计算。实验结果表明,在400 nm的位移量程内,压电纳米定位台每步进50 n m时,该方法测得最大绝对误差为5.8 nm。 展开更多
关键词 针孔点衍射 纳米位移测量 干涉条纹分析 高精度测量
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基于平行光束倾斜入射狭缝的反射衍射测量法理论推导与实验研究
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作者 刘思齐 楼宇丽 +2 位作者 宋庆和 张志远 梁茜媛 《昆明理工大学学报(自然科学版)》 北大核心 2025年第3期227-234,共8页
为解决当前反射衍射测量技术中斜入射条件下的精确解析描述缺失问题,本文基于瑞利-索末菲衍射积分公式,理论推导了平行光斜入射单缝时接收面光强分布的解析表达式,并通过数值模拟与实验的方法验证了其准确性.研究发现:衍射条纹在中心零... 为解决当前反射衍射测量技术中斜入射条件下的精确解析描述缺失问题,本文基于瑞利-索末菲衍射积分公式,理论推导了平行光斜入射单缝时接收面光强分布的解析表达式,并通过数值模拟与实验的方法验证了其准确性.研究发现:衍射条纹在中心零级两侧呈现不对称分布,且不对称性随入射角增大而显著增强,基于解析模型的缝宽推导结果与实验标称值比较吻合.本文建立了缝宽与系统参数的定量关系,完善了斜入射夫琅禾费衍射的理论框架,为非接触式无损检测中反射衍射测量技术的应用提供了可靠的理论依据. 展开更多
关键词 反射衍射法 解析描述 单缝衍射测量 夫琅禾费衍射
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管道焊接残余应力的X射线衍射法定量测试与数值模拟 被引量:3
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作者 李宇 蔡文昕 +6 位作者 高伟 陈永生 林中锋 王芳 江仰春 张世伟 张朱武 《热加工工艺》 北大核心 2025年第8期125-130,共6页
通过X射线衍射法对管道内、外表面焊接残余应力分布进行了定量测试。结果表明:外表面轴向焊接残余应力在焊缝区呈现压应力分布,压应力逐渐减小且转变为拉应力分布,在靠近母材区的热影响区达到应力峰值。在焊缝及热影响区,外表面环向焊... 通过X射线衍射法对管道内、外表面焊接残余应力分布进行了定量测试。结果表明:外表面轴向焊接残余应力在焊缝区呈现压应力分布,压应力逐渐减小且转变为拉应力分布,在靠近母材区的热影响区达到应力峰值。在焊缝及热影响区,外表面环向焊接残余应力均呈现拉应力分布,在热影响区达到应力峰值。内表面轴向和环向焊接残余应力在焊缝及热影响区均呈现拉应力分布,在热影响区达到应力峰值。同时应用有限元方法对管道焊接残余应力分布进行了数值模拟,通过对实验测试结果与数值模拟结果的对比和分析,验证了有限元模拟结果的准确性和可靠性。 展开更多
关键词 X射线衍射法 焊接残余应力 有限元 定量测试
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前向散射雷达回波特性及影响规律分析
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作者 郑雨晴 艾小锋 +2 位作者 徐志明 赵锋 谢晓霞 《电波科学学报》 北大核心 2025年第3期567-578,共12页
前向散射雷达(forward scatter radar,FSR)在低、慢、小目标探测中发挥着重大作用,研究目标穿越前向散射区时的回波特性具有重要意义。本文在近场发射近场接收条件下,针对菲涅尔-基尔霍夫衍射模型对目标实际散射场及总场的表征能力进行... 前向散射雷达(forward scatter radar,FSR)在低、慢、小目标探测中发挥着重大作用,研究目标穿越前向散射区时的回波特性具有重要意义。本文在近场发射近场接收条件下,针对菲涅尔-基尔霍夫衍射模型对目标实际散射场及总场的表征能力进行了分析,结果表明该模型仅在正前向很小的角度范围内有效,当目标处于第一菲涅尔区外时,由于目标表面感应电流产生的散射场增大,仅考虑衍射模型已不能准确反映总场及散射场的变化,还需考虑目标反射。以矩形平板目标为例,仿真分析了目标尺寸、运动参数和穿越基线位置对前向散射回波的影响规律,并通过暗室测量进行了验证。研究结论对FSR的实际应用具有理论指导作用。 展开更多
关键词 双基地雷达(BR) 前向散射雷达(FSR) 回波特性 衍射模型(DM) 电磁计算(EMC) 暗室测量
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Controlling the wavefront aberration of a largeaperture and high-precision holographic diffraction grating 被引量:1
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作者 Wenhao Li Xinyu Wang +9 位作者 Bayanheshig Zhaowu Liu Wei Wang Shan Jiang Yubo Li Shuo Li Wei Zhang Yanxiu Jiang Zheng Wu Wenyuan Zhou 《Light: Science & Applications》 2025年第4期1081-1093,共13页
The scanning interference field exposure technique is an effective method to fabricate holographic diffraction grating with meter-level size and nano-level precision.The main problems of fabricating large-aperture and... The scanning interference field exposure technique is an effective method to fabricate holographic diffraction grating with meter-level size and nano-level precision.The main problems of fabricating large-aperture and high-precision grating by this technique are the high-precision displacement measurement of the stage,the high-precision control of the interference fringe and the real time compensation of the grating phase error.In this paper,the influence of grating groove error on the wavefront aberration is analyzed.In order to improve the precision of the stage with displacement range more than one meter,an integrated displacement measurement combining grating sensing and laser interferometry is proposed,which suppresses the influence of environment on measurement precision under long displacement range.An interference fringe measurement method is proposed,which combines the diffraction characteristics of the measuring grating with the phase-shifting algorithm.By controlling the direction,period and phase nonlinear errors of the interference fringe,high quality interference fringe can be obtained.Further,a dynamic phase-locking model is established by using heterodyne interferometry to compensate grating phase error caused by stage motion error in real time.A grating with the aperture of 1500mm×420mm is fabricated.The wavefront aberration reaches 0.327λ@632.8 nm and the wavefront gradient reaches 16.444 nm/cm.This research presents a novel technique for the fabrication of meter-level size and nano-level precision holographic grating,which would further promote the development of chirped pulse amplification systems,high-energy laser and ultra-high precision displacement measurement. 展开更多
关键词 scanning interference field exposure fabricate holographic diffraction grating wavefront aberration scanning interference field exposure technique high precision fabrication displacement measurement large aperture holographic diffraction grating real time compensation
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基于点衍射干涉的三维形貌测量技术
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作者 赵时雨 高芬 《光子学报》 北大核心 2025年第5期135-143,共9页
为解决小区域复杂曲面三维形貌无损测量问题,提出一种基于点衍射干涉技术的三维形貌测量方法,将双光纤作为点衍射干涉条纹投射端,投射干涉条纹至待测件表面,对投影干涉条纹进行采集及处理,复原出被测物体三维形貌信息。提出了具体的三... 为解决小区域复杂曲面三维形貌无损测量问题,提出一种基于点衍射干涉技术的三维形貌测量方法,将双光纤作为点衍射干涉条纹投射端,投射干涉条纹至待测件表面,对投影干涉条纹进行采集及处理,复原出被测物体三维形貌信息。提出了具体的三维形貌测量光路方案,建立了系统测量模型,基于仿真投影相移干涉条纹对干涉图像处理算法进行研究,对相机以及系统结构参数进行标定,并搭建实际测量系统进行图像采集及处理,最后将系统测量结果与GOM公司ATOS Compact Scan三维扫描仪测量结果进行对比。实验结果表明,两种测量方法中心高度算术平均值相差仅0.0002 mm,搭建的点衍射干涉三维形貌测量系统中心高度测量结果标准差为0.0013 mm,验证了所提系统的可行性。研究成果有效实现了高精度三维形貌测量,可为点衍射干涉技术在三维形貌测量领域的扩展应用提供理论参考。 展开更多
关键词 干涉测量 三维测量 点衍射干涉仪 条纹投影 相位-高度复原
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