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A New Algorithm for Mining Frequent Pattern 被引量:2
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作者 李力 靳蕃 《Journal of Southwest Jiaotong University(English Edition)》 2002年第1期10-20,共11页
Mining frequent pattern in transaction database, time series databases, and many other kinds of databases have been studied popularly in data mining research. Most of the previous studies adopt Apriori like candidat... Mining frequent pattern in transaction database, time series databases, and many other kinds of databases have been studied popularly in data mining research. Most of the previous studies adopt Apriori like candidate set generation and test approach. However, candidate set generation is very costly. Han J. proposed a novel algorithm FP growth that could generate frequent pattern without candidate set. Based on the analysis of the algorithm FP growth, this paper proposes a concept of equivalent FP tree and proposes an improved algorithm, denoted as FP growth * , which is much faster in speed, and easy to realize. FP growth * adopts a modified structure of FP tree and header table, and only generates a header table in each recursive operation and projects the tree to the original FP tree. The two algorithms get the same frequent pattern set in the same transaction database, but the performance study on computer shows that the speed of the improved algorithm, FP growth * , is at least two times as fast as that of FP growth. 展开更多
关键词 data mining algorithm frequent pattern set FP growth
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The structure-based multi-fault test generation algorithm for combinational circuit
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作者 商庆华 吴丽华 项傅佳 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2006年第4期452-454,共3页
In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns o... In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns one tithe, so faults detection is very convenient. By simulation, the smallest test patterns set can be obtained and faults coverage rate is 100%. 展开更多
关键词 combinational circuit test generation the smallest test patterns set
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