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Uncertainty-aware Fourier ptychography
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作者 Ni Chen Yang Wu +3 位作者 Chao Tan Liangcai Cao Jun Wang Edmund Y.Lam 《Light(Science & Applications)》 2025年第9期2514-2529,共16页
Fourier ptychography(FP)offers both wide field-of-view and high-resolution holographic imaging,making it valuable for applications ranging from microscopy and X-ray imaging to remote sensing.However,its practical impl... Fourier ptychography(FP)offers both wide field-of-view and high-resolution holographic imaging,making it valuable for applications ranging from microscopy and X-ray imaging to remote sensing.However,its practical implementation remains challenging due to the requirement for precise numerical forward models that accurately represent real-world imaging systems.This sensitivity to model-reality mismatches makes FP vulnerable to physical uncertainties,including misalignment,optical element aberrations,and data quality limitations.Conventional approaches address these challenges through separate methods:manual calibration or digital correction for misalignment;pupil or probe reconstruction to mitigate aberrations;or data quality enhancement through exposure adjustments or high dynamic range(HDR)techniques.Critically,these methods cannot simultaneously address the interconnected uncertainties that collectively degrade imaging performance.We introduce Uncertainty-Aware FP(UA-FP),a comprehensive framework that simultaneously addresses multiple system uncertainties without requiring complex calibration and data collection procedures.Our approach develops a fully differentiable forward imaging model that incorporates deterministic uncertainties(misalignment and optical aberrations)as optimizable parameters,while leveraging differentiable optimization with domain-specific priors to address stochastic uncertainties(noise and data quality limitations).Experimental results demonstrate that UA-FP achieves superior reconstruction quality under challenging conditions.The method maintains robust performance with reduced sub-spectrum overlap requirements and retains high-quality reconstructions even with low bit sensor data.Beyond improving image reconstruction,our approach enhances system reconfigurability and extends FP's capabilities as a measurement tool suitable for operation in environments where precise alignment and calibration are impractical. 展开更多
关键词 uncertainty aware Fourier ptychography remote sensinghoweverits Fourier ptychography wide field view x ray imaging remote sensing fourier ptychography fp offers microscopy
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