期刊文献+
共找到15,950篇文章
< 1 2 250 >
每页显示 20 50 100
Interpretable Feature Learning and Band Gap Prediction for Titanium-based Semiconductors
1
作者 YUAN Binxia YANG Shen’ao +2 位作者 LIU Yuhao QIAN Hong ZHU Rui 《材料导报》 北大核心 2026年第7期184-191,共8页
Titanium-based semiconductors are known for their high chemical stability and suitable band gap widths.However,the conventional experimental screening methods are inefficient due to the wide variety of materials.To sp... Titanium-based semiconductors are known for their high chemical stability and suitable band gap widths.However,the conventional experimental screening methods are inefficient due to the wide variety of materials.To speed up the selection process,this work focuses on interpretable feature learning and band gap prediction for titanium-based semiconductors.First,titanium compounds were selected from the Materials Project database by machine learning,and elemental features were extracted using the Magpie descriptors.Then,principal component analysis(PCA)was applied to reduce the data dimensionality,creating a representative dataset.Meantime,heatmaps and SHAP(SHapley Additive exPlanations)methods were used to demonstrate the influence of key features such as electronegativity,covalent radius,period number,and unit cell volume on the bandgap,understanding the relationship between the material’s properties and performance.After comparing different machine learning models,including Random Forest(RF),Support Vector Machines(SVM),Linear Regression(LR),and Gradient Boosting Regression(GBR),the RF was found to be the most accurate for band gap prediction.Finally,the model performance was improved through parameter tuning,showing high accuracy.These findings provide strong data support and design guidance for the development of materials in fields like photocatalysis and solar cells. 展开更多
关键词 titanium-based semiconductors band gap feature ertraction PREDICTION random forest
在线阅读 下载PDF
Ligand-directed construction of cobalt-oxo cluster-based organic frameworks:Structural modulation,semiconductor,and antiferromagnetic properties
2
作者 SHI Jinlian LIU Xiaoru XU Zhongxuan 《无机化学学报》 北大核心 2026年第1期45-54,共10页
Under hydrothermal and solvothermal conditions,two novel cobalt-based complexes,{[Co_(2)(CIA)(OH)(1,4-dtb)]·3.2H_(2)O}n(HU23)and{[Co_(2)(CIA)(OH)(1,4-dib)]·3.5H2O·DMF}n(HU24),were successfully construct... Under hydrothermal and solvothermal conditions,two novel cobalt-based complexes,{[Co_(2)(CIA)(OH)(1,4-dtb)]·3.2H_(2)O}n(HU23)and{[Co_(2)(CIA)(OH)(1,4-dib)]·3.5H2O·DMF}n(HU24),were successfully constructed by coordinatively assembling the semi-rigid multidentate ligand 5-(1-carboxyethoxy)isophthalic acid(H₃CIA)with the Nheterocyclic ligands 1,4-di(4H-1,2,4-triazol-4-yl)benzene(1,4-dtb)and 1,4-di(1H-imidazol-1-yl)benzene(1,4-dib),respectively,around Co^(2+)ions.Single-crystal X-ray diffraction analysis revealed that in both complexes HU23 and HU24,the CIA^(3-)anions adopt aκ^(7)-coordination mode,bridging six Co^(2+)ions via their five carboxylate oxygen atoms and one ether oxygen atom.This linkage forms tetranuclear[Co4(μ3-OH)2]^(6+)units.These Co-oxo cluster units were interconnected by CIA^(3-)anions to assemble into 2D kgd-type structures featuring a 3,6-connected topology.The 2D layers were further connected by 1,4-dtb and 1,4-dib,resulting in 3D pillar-layered frameworks for HU23 and HU24.Notably,despite the similar configurations of 1,4-dtb and 1,4-dib,differences in their coordination spatial orientations lead to topological divergence in the 3D frameworks of HU23 and HU24.Topological analysis indicates that the frameworks of HU23 and HU24 can be simplified into a 3,10-connected net(point symbol:(4^(10).6^(3).8^(2))(4^(3))_(2))and a 3,8-connected tfz-d net(point symbol:(4^(3))_(2)((4^(6).6^(18).8^(4)))),respectively.This structural differentiation confirms the precise regulatory role of ligands on the topology of metal-organic frameworks.Moreover,the ultraviolet-visible absorption spectra confirmed that HU23 and HU24 have strong absorption capabilities for ultraviolet and visible light.According to the Kubelka-Munk method,their bandwidths were 2.15 and 2.08 eV,respectively,which are consistent with those of typical semiconductor materials.Variable-temperature magnetic susceptibility measurements(2-300 K)revealed significant antiferromagnetic coupling in both complexes,with their effective magnetic moments decreasing markedly as the temperature lowered.CCDC:2457554,HU23;2457553,HU24. 展开更多
关键词 semi-rigid carboxylic acid ligands three-dimensional framework tetranuclear cobalt-oxo cluster semiconductor material antiferromagnetic magnetism
在线阅读 下载PDF
Efficient Photo-patterning of Polymer Semiconductors with a Fourarmed Diazo-based Oligomer Cross-linker
3
作者 Chang-Chun Wu Jia-Feng Dong +8 位作者 Kai-Yuan Chenchai Liang-Liang Chen Tian-Yu Shi Jun-Long Ma Zi-Meng Li Jian-Hong Zhao Hong-Jun Zang Guan-Xin Zhang De-Qing Zhang 《Chinese Journal of Polymer Science》 2026年第4期937-949,I0008,共14页
Efficient photo-patterning of polymer semiconductors with cross-linkers has emerged as a promising route to fabricate organic integrated circuits via all-solution processing techniques.Herein,we report a new four-arme... Efficient photo-patterning of polymer semiconductors with cross-linkers has emerged as a promising route to fabricate organic integrated circuits via all-solution processing techniques.Herein,we report a new four-armed diazo-based oligomer photo-crosslinker 2DPP4N_(2)for the patterning of semiconducting polymers by UV light-induced crossing-linking reaction.After blending 2DPP4N_(2)with polymer semiconductors such as PDPP4T(p-type),PDPP3T(ambipolar)and N2200(n-type),we prepared various patterns with a resolution of 6μm by irradiating through a photo-mask with 254 nm UV light for 160 s.Notably,the interchain packing and surface morphology remained nearly unchanged after photo-patterning,as characterized by atomic force microscopy(AFM)and grazing incidence wide-angle X-ray scattering(GIWAXS).Consequently,the charge transport property of the patterned thin film was largely maintained in comparison to that of its pristine thin film.These results reveal that 2DPP4N_(2)is a viable and promising candidate for application in all-solution-processable flexible integrated electronic devices. 展开更多
关键词 Photo-crosslinker DIAZO Photo-patterning Polymer semiconductor
原文传递
Violet Arsenic Phosphorus:Switching p-Type into High Performance n-Type Semiconductor by Arsenic Substitution
4
作者 Rui Zhai Zhuorui Wen +7 位作者 Xuewen Zhao Junyi She Mengyue Gu Fanqi Bu Chang Huang Guodong Meng Yonghong Cheng Jinying Zhang 《Nano-Micro Letters》 2026年第5期93-106,共14页
Violet phosphorus,a recently explored layered elemental semiconductor,has attracted much attention due to its unique photoelectric,mechanical properties,and high hole mobility.Herein,violet arsenic phosphorus has for ... Violet phosphorus,a recently explored layered elemental semiconductor,has attracted much attention due to its unique photoelectric,mechanical properties,and high hole mobility.Herein,violet arsenic phosphorus has for the first time been synthesized by a molten lead method.The crystal structure of violet arsenic phosphorus(P^(83.4)As_(0.6),CSD-2408761)was determined by single crystal X-ray diffraction to have similar structure as that of violet phosphorus,where P12 is occupied by arsenic/phosphorus(As/P)atoms as mixed occupancy sites As1/P12.The arsenic substitution has been demonstrated to tune the band structure of violet phosphorus,switching p-type of violet phosphorus to high-performance n-type violet arsenic phosphorus.The effective electron mass along the<010>direction is significantly reduced from 1.792 to 0.515 m_(0)by arsenic substitution,resulting in an extremely high electron mobility of 2622.503 cm^(2)V^(-1)s^(-1).The field effect transistor built with P_(83.4)As_(0.6)nanosheets was measured to have a high electron mobility(137.06 cm^(2)V^(-1)s^(-1),61.2 nm),even under ambient conditions for 5 h,much higher than the hole mobility of violet phosphorene nanosheets(4.07 cm^(2)V^(-1)s^(-1),73.3 nm).This work provides a new idea for designing phosphorus-based materials for field effect transistors,giving significant potential in complementary metal-oxide-semiconductor applications. 展开更多
关键词 Violet phosphorus Arsenic substitution n-type semiconductor High mobility Field effect transistor
在线阅读 下载PDF
Generalized semi-analytical modeling of three-dimensional contact responses in piezoelectric semiconductors with conductive indenters
5
作者 Ling WANG Huoming SHEN Yuxing WANG 《Applied Mathematics and Mechanics(English Edition)》 2026年第3期555-572,共18页
Piezoelectric semiconductor(PSC)materials exhibit strong electromechanical coupling affected by free carriers,which makes their contact behavior essential for sensors,actuators,and electronic devices.Analytical models... Piezoelectric semiconductor(PSC)materials exhibit strong electromechanical coupling affected by free carriers,which makes their contact behavior essential for sensors,actuators,and electronic devices.Analytical models for three-dimensional(3D)PSC contact problems are still scarce,especially for conductive indenters.This work develops a semi-analytical framework to study the 3D frictionless contact between a conductive indenter and a PSC half-space.Fundamental solutions under a unit force and a unit electric charge are derived,and the corresponding frequency response functions are combined with a discrete convolution-fast Fourier transform(DC-FFT)algorithm to achieve an efficient semi-analytical contact model.The numerical results demonstrate that an increase in the surface charge density reduces the indentation pressure and modifies the electric potential distribution.A higher steady carrier concentration enhances the screening effect,suppresses the electromechanical coupling,and shifts the system response toward purely elastic behaviors.The sensitivity analysis shows that the indentation depth is dominated by the elastic constants,while the electric potential is mainly affected by the piezoelectric coefficient.Although the analysis is carried out with spherical indenters,the model is not limited to a specific indenter shape.It provides an effective tool for investigating complex 3D PSC contact problems and offers useful insights into the design of PSC materials-based devices. 展开更多
关键词 contact mechanics semi-analytical method piezoelectric semiconductor(PSC) conductive indenter electromechanical response
在线阅读 下载PDF
Static and dynamic responses of a piezoelectric semiconductor beam under different boundary conditions
6
作者 Guoquan NIE Zhiwei WU Jinxi LIU 《Applied Mathematics and Mechanics(English Edition)》 2026年第2期303-324,共22页
Due to the intrinsic interaction between piezoelectric effects and semiconducting properties,piezoelectric semiconductors(PSs)have great promise for applications in multi-functional electronic devices,requiring a deep... Due to the intrinsic interaction between piezoelectric effects and semiconducting properties,piezoelectric semiconductors(PSs)have great promise for applications in multi-functional electronic devices,requiring a deep understanding of the multi-field coupling behavior.This work investigates the free vibration and buckling characteristics of a PS beam under different mechanical boundary conditions.The coupling fields of a PS beam are modeled by combining the Timoshenko beam theory for mechanical fields with a high-order expansion along the beam thickness for electric fields and carrier distributions.Based on the hypothesis of small perturbation of carrier density,the governing equations and boundary conditions are derived with the principle of virtual work.The differential quadrature method(DQM)is used to solve the boundary-value problem.The analytical solutions for a simply supported-simply supported(SS)PS beam are also obtained for verification.The convergence and correctness of the solutions obtained with the DQM are first evaluated.Subsequently,the effects of initial electron density,boundary conditions,and geometric parameters on the vibration and buckling characteristics are explored through numerical examples,where the finite element simulations are also included.The interaction mechanism of multi-physics fields is revealed.The scale effect on the static and dynamic responses of a PS beam is demonstrated.The derived model and findings are useful for the analysis and design of PS-based devices. 展开更多
关键词 piezoelectric semiconductor(PS) BEAM vibration BUCKLING differential quadrature method(DQM) finite element
在线阅读 下载PDF
Electro-mechanical-carrier coupling model in fractured piezoelectric semiconductor strip with vertical cracks
7
作者 Cai REN Kaifa WANG Baolin WANG 《Applied Mathematics and Mechanics(English Edition)》 2026年第2期347-368,共22页
Understanding the fracture behavior of vertical cracks in piezoelectric semiconductor(PS)structures is vital due to their impacts on device reliability.This study establishes a model for a PS strip with a vertical cra... Understanding the fracture behavior of vertical cracks in piezoelectric semiconductor(PS)structures is vital due to their impacts on device reliability.This study establishes a model for a PS strip with a vertical crack under combined mechanical and electric loading,considering both central and edge cracks.Using Fourier transforms and dislocation density functions,the Mode-Ⅲproblem is converted to Cauchy-type singular integral equations.The crack surface fields,intensity factors,and energy release rate are derived.The accuracy of the proposed model is verified through the finite element(FE)simulation via COMSOL Multiphysics.The results for low electron concentrations align with those of the intrinsic piezoelectric materials,validating the correctness of the present model as well.The combined effects of crack position,applied electric loading,and initial carrier concentration on the crack propagation are analyzed.The normalized electric displacement factor shows heightened sensitivity to crack size,electromechanical loading,and carrier concentration.The crack position significantly influences the crack surface fields and normalized intensity factors due to the boundary proximity effect. 展开更多
关键词 piezoelectric semiconductor(PS) vertical crack singular integral equation electro-mechanical-carrier coupling extended intensity factor
在线阅读 下载PDF
Oxide Semiconductor for Advanced Memory Architectures:Atomic Layer Deposition,Key Requirement and Challenges
8
作者 Chi‑Hoon Lee Seong‑Hwan Ryu +3 位作者 Taewon Hwang Sang‑Hyun Kim Yoon‑Seo Kim Jin‑Seong Park 《Nano-Micro Letters》 2026年第6期80-124,共45页
Oxide semiconductors(OSs),introduced by the Hosono group in the early 2000s,have evolved from display backplane materials to promising candidates for advanced memory and logic devices.The exceptionally low leakage cur... Oxide semiconductors(OSs),introduced by the Hosono group in the early 2000s,have evolved from display backplane materials to promising candidates for advanced memory and logic devices.The exceptionally low leakage current of OSs and compatibility with three-dimensional(3D)architectures have recently sparked renewed interest in their use in semiconductor applications.This review begins by exploring the unique material properties of OSs,which fundamentally originate from their distinct electronic band structure.Subsequently,we focus on atomic layer deposition(ALD),a core technique for growing excellent OS films,covering both basic and advanced processes compatible with 3D scaling.The basic surface reaction mechanisms—adsorption and reaction—and their roles in film growth are introduced.Furthermore,material design strategies,such as cation selection,crystallinity control,anion doping,and heterostructure engineering,are discussed.We also highlight challenges in memory applications,including contact resistance,hydrogen instability,and lack of p-type materials,and discuss the feasibility of ALD-grown OSs as potential solutions.Lastly,we provide an outlook on the role of ALD-grown OSs in memory technologies.This review bridges material fundamentals and device-level requirements,offering a comprehensive perspective on the potential of ALD-driven OSs for next-generation semiconductor memory devices. 展开更多
关键词 Oxide semiconductor(OS) Atomic layer deposition(ALD) Memory applications
在线阅读 下载PDF
Room-Temperature Ferromagnetism via Superexchange in Semiconductor(Cr_(4/6),Mo_(2/6))_(3)Te_(6)
9
作者 Jia-Wen Li Gang Su Bo Gu 《Chinese Physics Letters》 2025年第9期146-162,共17页
Realizing ferromagnetic semiconductors with high Curie temperature TC is still a challenge in spintronics.Recent experiments have reported two-dimensional(2D)room temperature ferromagnetic metals,such as monolayer Cr_... Realizing ferromagnetic semiconductors with high Curie temperature TC is still a challenge in spintronics.Recent experiments have reported two-dimensional(2D)room temperature ferromagnetic metals,such as monolayer Cr_(3)Te_(6).In this paper,through density functional theory(DFT)calculations,we propose a method to obtain 2D high TC ferromagnetic semiconductors through element replacement in these ferromagnetic metals.We predict that monolayer(Cr_(4/6),Mo_(2/6))_(3)Te_(6),created via element replacement in monolayer Cr_(3)Te_(6),is a room-temperature ferromagnetic semiconductor exhibiting a band gap of 0.34 eV and a TC of 384 K.Our analysis reveals that the metal-to-semiconductor transition stems from the synergistic interplay of Mo-induced lattice distortion,which resolves band overlap,and the electronic contributions of Mo dopants,which further drive the formation of a distinct band gap.The origin of the high TC is traced to strong superexchange coupling between magnetic ions,analyzed via the superexchange model with DFT and Wannier function calculations.Considering the fast developments in fabrication and manipulation of 2D materials,our theoretical results propose an approach to explore high-temperature ferromagnetic semiconductors derived from experimentally obtained 2D high-temperature ferromagnetic metals through element replacement. 展开更多
关键词 ferromagnetic semiconductors ferromagnetic metalswe MONOLAYER density functional theory dft calculationswe room temperature ferromagnetism element replacement ferromagnetic metalssuch semiconductor
原文传递
On-chip light control of semiconductor optoelectronic devices using integrated metasurfaces 被引量:4
10
作者 Cheng-Long Zheng Pei-Nan Ni +1 位作者 Yi-Yang Xie Patrice Genevet 《Opto-Electronic Advances》 2025年第1期5-30,共26页
Semiconductor optoelectronics devices,capable of converting electrical power into light or conversely light into electrical power in a compact and highly efficient manner represent one of the most advanced technologie... Semiconductor optoelectronics devices,capable of converting electrical power into light or conversely light into electrical power in a compact and highly efficient manner represent one of the most advanced technologies ever developed,which has profoundly reshaped the modern life with a wide range of applications.In recent decades,semiconductor technology has rapidly evolved from first-generation narrow bandgap materials(Si,Ge)to the latest fourth-generation ultra-wide bandgap semiconductor(GaO,diamond,AlN)with enhanced performance to meet growing demands.Additionally,merging semiconductor devices with other techniques,such as computer assisted design,state-of-the-art micro/nano fabrications,novel epitaxial growth,have significantly accelerated the development of semiconductor optoelectronics devices.Among them,integrating metasurfaces with semiconductor optoelectronic devices have opened new frontiers for on-chip control of their electromagnetic response,providing access to previously inaccessible degrees of freedom.We review the recent advances in on-chip control of a variety of semiconductor optoelectronic devices using integrated metasurfaces,including semiconductor lasers,semiconductor light emitting devices,semiconductor photodetectors,and low dimensional semiconductors.The integration of metasurfaces with semiconductors offers wafer-level ultracompact solutions for manipulating the functionalities of semiconductor devices,while also providing a practical platform for implementing cuttingedge metasurface technology in real-world applications. 展开更多
关键词 OPTOELECTRONICS NANOPHOTONICS metasurfaces semiconductor
在线阅读 下载PDF
Lamb waves in multilayered piezoelectric semiconductor plates 被引量:1
11
作者 Ru TIAN Lisha YI +3 位作者 Guoquan NIE Jinxi LIU Ernian PAN Yuesheng WANG 《Applied Mathematics and Mechanics(English Edition)》 2025年第8期1493-1510,I0012-I0015,共22页
In this paper,we theoretically study the Lamb wave in a multilayered piezoelectric semiconductor(PSC)plate,where each layer is an n-type PSC with the symmetry of transverse isotropy.Based on the extended Stroh formali... In this paper,we theoretically study the Lamb wave in a multilayered piezoelectric semiconductor(PSC)plate,where each layer is an n-type PSC with the symmetry of transverse isotropy.Based on the extended Stroh formalism and dual-variable and position(DVP)method,the general solution of the coupled fields for the Lamb wave is derived,and then the dispersion equation is obtained by the application of the boundary conditions.First,the influence of semiconducting properties on the dispersion behavior of the Lamb wave in a single-layer PSC plate is analyzed.Then,the propagation characteristics of the Lamb wave in a sandwich plate are investigated in detail.The numerical results show that the wave speed and attenuation depend on the stacking sequence,layer thickness,and initial carrier density,the Lamb wave can propagate without a cut-off frequency in both the homogeneous and multilayer PSC plates due to the semiconducting properties,and the Lamb wave without attenuation can be achieved by carefully selecting the semiconductor property in the upper and lower layers.These new features could be very helpful as theoretical guidance for the design and performance optimization of PSC devices. 展开更多
关键词 piezoelectric semiconductor(PSC) Lamb wave multilayer plate dispersion ATTENUATION
在线阅读 下载PDF
Predictive models for the surface roughness and subsurface damage depth of semiconductor materials in precision grinding 被引量:1
12
作者 Shang Gao Haoxiang Wang +2 位作者 Han Huang Zhigang Dong Renke Kang 《International Journal of Extreme Manufacturing》 2025年第3期423-449,共27页
Workpiece rotational grinding is widely used in the ultra-precision machining of hard and brittle semiconductor materials,including single-crystal silicon,silicon carbide,and gallium arsenide.Surface roughness and sub... Workpiece rotational grinding is widely used in the ultra-precision machining of hard and brittle semiconductor materials,including single-crystal silicon,silicon carbide,and gallium arsenide.Surface roughness and subsurface damage depth(SDD)are crucial indicators for evaluating the surface quality of these materials after grinding.Existing prediction models lack general applicability and do not accurately account for the complex material behavior under grinding conditions.This paper introduces novel models for predicting both surface roughness and SDD in hard and brittle semiconductor materials.The surface roughness model uniquely incorporates the material’s elastic recovery properties,revealing the significant impact of these properties on prediction accuracy.The SDD model is distinguished by its analysis of the interactions between abrasive grits and the workpiece,as well as the mechanisms governing stress-induced damage evolution.The surface roughness model and SDD model both establish a stable relationship with the grit depth of cut(GDC).Additionally,we have developed an analytical relationship between the GDC and grinding process parameters.This,in turn,enables the establishment of an analytical framework for predicting surface roughness and SDD based on grinding process parameters,which cannot be achieved by previous models.The models were validated through systematic experiments on three different semiconductor materials,demonstrating excellent agreement with experimental data,with prediction errors of 6.3%for surface roughness and6.9%for SDD.Additionally,this study identifies variations in elastic recovery and material plasticity as critical factors influencing surface roughness and SDD across different materials.These findings significantly advance the accuracy of predictive models and broaden their applicability for grinding hard and brittle semiconductor materials. 展开更多
关键词 surface quality GRINDING predictive models semiconductor materials surface roughness subsurface damage depth
在线阅读 下载PDF
Controllable two-dimensional asymmetric diffraction grating via vortex light in a semiconductor double quantum wells system 被引量:1
13
作者 Kunpeng Zhao Duo Zhang +1 位作者 Junbing Guo Jiaqian Li 《Communications in Theoretical Physics》 2025年第8期49-58,共10页
We present a theoretical scheme to realize two-dimensional(2D)asymmetric diffraction grating in a five-level inverted Y-type asymmetric double semiconductor quantum wells(SQWs)structure with resonant tunneling.The SQW... We present a theoretical scheme to realize two-dimensional(2D)asymmetric diffraction grating in a five-level inverted Y-type asymmetric double semiconductor quantum wells(SQWs)structure with resonant tunneling.The SQW structure interacts with a weak probe laser field,a spatially independent 2D standing-wave(SW)field,and a Laguerre–Gaussian(LG)vortex field,respectively.The results indicate that the diffraction patterns are highly sensitive to amplitude modulation and phase modulation.Because of the existence of vortex light,it is possible to realize asymmetric high-order diffraction in the SQW structure,and then a 2D asymmetric grating is established.By adjusting the detunings of the probe field,vortex field,and SW field,as well as the interaction length,diffraction intensity,and direction of the 2D asymmetric electromagnetically induced grating(EIG)can be controlled effectively.In addition,the number of orbital angular momenta(OAM)and beam waist parameter can be used to modulate the diffraction intensity and energy transfer of the probe light in different regions.High-order diffraction intensity is enhanced and high-efficiency 2D asymmetric diffraction grating with different diffraction patterns is obtained in the scheme.Such 2D asymmetric diffraction grating may be beneficial to the research of optical communication and innovative semiconductor quantum devices. 展开更多
关键词 asymmetric diffraction grating standing-wave field laguerre-gaussian vortex field diffraction property semiconductor quantum well
原文传递
Optical Spectroscopy Methods for Determining Semiconductor Bandgaps
14
作者 ZHANG Yong 《发光学报》 北大核心 2025年第7期1271-1282,共12页
Although there are numerous optical spectroscopy techniques and methods that have been used to extract the fundamental bandgap of a semiconductor,most of them belong to one of these three approaches:(1)the excitonic a... Although there are numerous optical spectroscopy techniques and methods that have been used to extract the fundamental bandgap of a semiconductor,most of them belong to one of these three approaches:(1)the excitonic absorption,(2)modulation spectroscopy,and(3)the most widely used Tauc-plot.The excitonic absorption is based on a many-particle theory,which is physically the most correct approach,but requires more stringent crystalline quality and appropriate sample preparation and experimental implementation.The Tauc-plot is based on a single-particle theo⁃ry that neglects the many-electron effects.Modulation spectroscopy analyzes the spectroscopy features in the derivative spectrum,typically,of the reflectance and transmission under an external perturbation.Empirically,the bandgap ener⁃gy derived from the three approaches follow the order of E_(ex)>E_(MS)>E_(TP),where three transition energies are from exci⁃tonic absorption,modulation spectroscopy,and Tauc-plot,respectively.In principle,defining E_(g) as the single-elec⁃tron bandgap,we expect E_(g)>E_(ex),thus,E_(g)>E_(TP).In the literature,E_(TP) is often interpreted as E_(g),which is conceptual⁃ly problematic.However,in many cases,because the excitonic peaks are not readily identifiable,the inconsistency be⁃tween E_(g) and E_(TP) becomes invisible.In this brief review,real world examples are used(1)to illustrate how excitonic absorption features depend sensitively on the sample and measurement conditions;(2)to demonstrate the differences between E_(ex),E_(MS),and E_(TP) when they can be extracted simultaneously for one sample;and(3)to show how the popular⁃ly adopted Tauc-plot could lead to misleading results.Finally,it is pointed out that if the excitonic absorption is not ob⁃servable,the modulation spectroscopy can often yield a more useful and reasonable bandgap than Tauc-plot. 展开更多
关键词 semiconductor material bandgap excitonic absorption modulation spectroscopy Tauc plot
在线阅读 下载PDF
Research Progress on Corrosion-Resistant Coatings of Carbon-Based Materials for the Semiconductor Field
15
作者 Jianxin TU Kui HAO +5 位作者 Caixia HUO Ziyuan GUO Jianhao WANG Aijun LI Ruicheng BAI Zhihao JI 《中国材料进展》 北大核心 2025年第7期636-647,共12页
Semiconductors and related fields today hold vast application prospects.The semiconductor wafer fabrication process involves steps such as substrate preparation and epitaxy,which occur in high-temperature corrosive en... Semiconductors and related fields today hold vast application prospects.The semiconductor wafer fabrication process involves steps such as substrate preparation and epitaxy,which occur in high-temperature corrosive environments.Consequently,components like crucibles,susceptors and wafer carriers require carbon-based materials such as graphite and carbon-carbon composites.However,traditional carbon materials underperform in these extreme conditions,failing to effectively address the challenges.This leads to issues including product contamination and shortened equipment lifespan.Therefore,effective protection of carbon materials is crucial.This paper reviews current research status on the preparation methods and properties of corrosion-resistant coatings within relevant domestic and international fields.Preparation methods include various techniques such as physical vapor deposition(PVD),chemical vapor deposition(CVD)and the sol-gel method.Furthermore,it offers perspectives on future research directions for corrosion-resistant coated components in semiconductor equipment.These include exploring novel coating materials,improving coating preparation processes,enhancing coating corrosion resistance,as well as further investigating the interfacial interactions between coatings and carbon substrates to achieve better adhesion and compatibility. 展开更多
关键词 semiconductor high-temperature corrosion corrosive atmosphere carbon materials corrosion-resistant coatings silicon carbide tantalum carbide
在线阅读 下载PDF
Visible to near-infrared photodetector based on organic semiconductor single crystal
16
作者 LI Xiang HU Jin-Han +7 位作者 ZHONG Zhi-Peng CHEN Yu-Zhong WANG Zhi-Qiang SONG Miao-Miao WANG Yang ZHANG Lei LI Jian-Feng HUANG Hai 《红外与毫米波学报》 北大核心 2025年第1期46-51,共6页
Organic semiconductor materials have shown unique advantages in the development of optoelectronic devices due to their ease of preparation,low cost,lightweight,and flexibility.In this work,we explored the application ... Organic semiconductor materials have shown unique advantages in the development of optoelectronic devices due to their ease of preparation,low cost,lightweight,and flexibility.In this work,we explored the application of the organic semiconductor Y6-1O single crystal in photodetection devices.Firstly,Y6-1O single crystal material was prepared on a silicon substrate using solution droplet casting method.The optical properties of Y6-1O material were characterized by polarized optical microscopy,fluorescence spectroscopy,etc.,confirming its highly single crystalline performance and emission properties in the near-infrared region.Phototransistors based on Y6-1O materials with different thicknesses were then fabricated and tested.It was found that the devices exhibited good visible to near-infrared photoresponse,with the maximum photoresponse in the near-infrared region at 785 nm.The photocurrent on/off ratio reaches 10^(2),and photoresponsivity reaches 16 mA/W.It was also found that the spectral response of the device could be regulated by gate voltage as well as the material thickness,providing important conditions for optimizing the performance of near-infrared photodetectors.This study not only demonstrates the excellent performance of organic phototransistors based on Y6-1O single crystal material in near-infrared detection but also provides new ideas and directions for the future development of infrared detectors. 展开更多
关键词 near-infrared photodetector organic semiconductor Y6-1O single crystal spectral response
在线阅读 下载PDF
Performance Assessment of Semiconductor Detector Used in Diagnostics and Interventional Radiology at the Nigerian Secondary Standard Dosimetry Laboratory
17
作者 Samuel Mofolorunsho Oyeyemi Olumide Olaife Akerele +6 位作者 David Olakanmi Olaniyi Francis Adole Agada Sherif Olaniyi Kelani Akinkunmi Emmanuel Ladapo Ahmed Mohammed Shiyanbade Bamidele Musbau Adeniran Latifat Ronke Owoade 《World Journal of Nuclear Science and Technology》 2025年第1期17-29,共13页
Radiation doses to patients in diagnostics and interventional radiology need to be optimized to comply with the principles of radiation protection in medical practice. This involves using specific detectors with respe... Radiation doses to patients in diagnostics and interventional radiology need to be optimized to comply with the principles of radiation protection in medical practice. This involves using specific detectors with respective diagnostic beams to carry out quality control/quality assurance tests needed to optimize patient doses in the hospital. Semiconductor detectors are used in dosimetry to verify the equipment performance and dose to patients. This work aims to assess the performance, energy dependence, and response of five commercially available semiconductor detectors in RQR, RQR-M, RQA, and RQT at Secondary Standard Dosimetry for clinical applications. The diagnostic beams were generated using Exradin A4 reference ion chamber and PTW electrometer. The ambient temperature and pressure were noted for KTP correction. The detectors designed for RQR showed good performance in RQT beams and vice versa. The detectors designed for RQR-M displayed high energy dependency in other diagnostic beams. The type of diagnostic beam quality determines the response of semiconductor detectors. Therefore, a detector should be calibrated according to the beam qualities to be measured. 展开更多
关键词 semiconductor Detectors Optimization of Protection CALIBRATION Patient Dose Diagnostic Radiology
在线阅读 下载PDF
Research on heterojunction semiconductor photodetectors based on CsPbBr_(3) QDs/CsPbBr_(x)I_(3-x) QDs
18
作者 Chenguang Shen Mengwei Chen +1 位作者 Wei Huang Yingping Yang 《Journal of Semiconductors》 2025年第10期89-97,共9页
All-inorganic CsPbBr_(3) perovskite quantum dots(QDs)have attracted extensive attention in photoelectric detection for their excellent photoelectric properties and stability.However,the CsPbBr_(3) quantum dot film exh... All-inorganic CsPbBr_(3) perovskite quantum dots(QDs)have attracted extensive attention in photoelectric detection for their excellent photoelectric properties and stability.However,the CsPbBr_(3) quantum dot film exhibits a high non-radiative recombination rate,and the mismatch in energy levels with the carbon electrode weakens hole extraction efficiency.These reduces the device's performance.To improve this,a semiconductor photodetector based on fluorine-doped tin oxide(FTO)/dense titanium dioxide(c-TiO_(2))/mesoporous titanium dioxide(m-TiO_(2))/CsPbBr_(3) QDs/CsPbBr_(x)I_(3-x)(x=2,1.5,1)QDs/C struc-ture was studied.By adjusting the Br-:I-ratio,the synthesized CsPbBr_(x)I_(3-x)(x=2,1.5,1)QDs showed an adjustable band gap width of 2.284-2.394 eV.And forming a typeⅡband structure with CsPbBr_(3) QDs,which reduced the valence band offset between the active layer and the carbon electrode,this promoted carrier extraction and reduced non-radiative recombination rate.Compared with the original device(the photosensitive layer is CsPbBr_(3) QDs),the performance of the photodetector based on the CsPbBr_(3) QDs/CsPbBr2I QDs heterostructure is significantly improved,the responsivity(R)increased by 73%,the specific detectivity rate(D^(*))increased from 6.98×10^(12) to 3.19×10^(13) Jones,the on/off ratio reached 106.This study provides a new idea for the development of semiconductor tandem detectors. 展开更多
关键词 photodetector all-inorganic perovskite quantum dots semiconductor heterostructure
在线阅读 下载PDF
Critical Role of Intermetallic Particles in the Corrosion of 6061 Aluminum Alloy and Anodized Aluminum Used in Semiconductor Processing Equipment
19
作者 Yang Zhao Bo He +3 位作者 Jinliang Yang Yongxiang Liu Tao Zhang Fuhui Wang 《Acta Metallurgica Sinica(English Letters)》 2025年第6期904-924,共21页
The effect of intermetallic particles on the corrosion of 6061 aluminum alloy and its coating used in semiconductor processing systems was systematically studied via liquid and gas experiments and micromorphology char... The effect of intermetallic particles on the corrosion of 6061 aluminum alloy and its coating used in semiconductor processing systems was systematically studied via liquid and gas experiments and micromorphology characterization.The results revealed that a huge difference of corrosion resistance between imported and domestic 6061 aluminum alloys in HCl solution and gas acid mist experiments mainly was attributed to the different size and amount of Al_(15)(Fe,Mn)_(3)Si_(2).The corrosion resistance of domestic 6061 alloy in dry/wet semiconductor electronic special gas environments was worse than that of imported aluminum alloy,and there are great differences in the corrosion mechanism of 6061 alloy caused by the second phase in the two dry/wet environments.And the corrosion resistance of the hard anodized alumina film was closely related to the microscopic morphology of holes.The vertical and elongatedα-Al_(15)(Mn,Fe)_(3)Si_(2) phase was formed in the rolled aluminum alloy that has been rolled perpendicular to the surface of the substrate.Compared to the horizontal long hole,the longitudinal long holes generated by the verticalα-Al_(15)(Mn,Fe)_(3)Si_(2) phase will enable the corrosive medium to reach the substrate rapidly,which significantly weakens the corrosion resistance of the hard anodized film. 展开更多
关键词 semiconductor Intermetallic particles Anodized aluminum CORROSION
原文传递
Cross-scale mechanical manipulation of mobile charges in centrosymmetric semiconductors via interplay between piezoelectricity and flexoelectricity
20
作者 Chao Wei Ziwen Guo +1 位作者 Jian Tang Wenbin Huang 《Acta Mechanica Sinica》 2025年第9期120-137,共18页
Flexoelectricity,an electromechanical coupling between strain gradient and electrical polarization in dielectrics or semiconductors,has attracted significant scientific interest.It is reported that large flexoelectric... Flexoelectricity,an electromechanical coupling between strain gradient and electrical polarization in dielectrics or semiconductors,has attracted significant scientific interest.It is reported that large flexoelectric behaviors can be obtained at the nanoscale because of the size effect.However,the flexoelectric responses of centrosymmetric semiconductors(CSs)are extremely weak under a conventional beam-bending approach,owing to weak flexoelectric coefficients and small strain gradients.The flexoelectric-like effect is an enhanced electromechanical effect coupling the flexoelectricity and piezoelectricity.In this paper,a composite structure consisting of piezoelectric dielectric layers and a CS layer is proposed.The electromechanical response of the CS is significantly enhanced via antisymmetric piezoelectric polarization.Consequently,the cross-scale mechanically tuned carrier distribution in the semiconductor is realized.Meanwhile,the significant size dependence of the electromechanical fields in the semiconductor is demonstrated.The flexoelectronics suppression is found when the semiconductor thickness reaches a critical size(0.8μm).In addition,the first-order carrier density of the composite structure under local loads is illustrated.Our results can suggest the structural design for flexoelectric semiconductor devices. 展开更多
关键词 Cross-scale mechanical manipulation FLEXOELECTRICITY PIEZOELECTRICITY semiconductor
原文传递
上一页 1 2 250 下一页 到第
使用帮助 返回顶部